Artificial neural network based controller for fast and accurate atomic force microscope /
Despite its wide use in Atomic Force Microscopies (AFM), the performance of Piezoelectric Tube Scanner is limited by vibration and inherent nonlinearities that include hysteresis and creep. These limitations restrict the use of Piezoelectric Tube Scanner in fast and accurate operation of atomic forc...
Saved in:
主要作者: | Othman, Yahya Sherif |
---|---|
格式: | Thesis |
語言: | English |
出版: |
Kuala Lumpur:
Kulliyyah of Engineering, International Islamic University Malaysia,
2013
|
主題: | |
在線閱讀: | Click here to view 1st 24 pages of the thesis. Members can view fulltext at the specified PCs in the library. |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Wear characterisation of magnetic hard disk coatings using atomic force microscope /
由: Man, Yijun
出版: (1997) -
Fast and accurate ray optical propagation model for indoor applications /
由: Reza, Ahmed Wasif
出版: (2012) -
Digital Implementation of Artificial Neural Networks /
由: Faycal, Saffih
出版: (1998) -
Fabrication and simulation of P-type junctionless silicon nanowire transistor using silicon on insulator and atomic force microscope nano lithography
由: Dehzangi, Arash
出版: (2012) -
High capacity image steganography algorithm based on artificial neural network /
由: Al-Jbara, Hamsah Ahmed Ghaleb
出版: (2013)