Artificial neural network based controller for fast and accurate atomic force microscope /
Despite its wide use in Atomic Force Microscopies (AFM), the performance of Piezoelectric Tube Scanner is limited by vibration and inherent nonlinearities that include hysteresis and creep. These limitations restrict the use of Piezoelectric Tube Scanner in fast and accurate operation of atomic forc...
Saved in:
| 主要作者: | |
|---|---|
| 格式: | Thesis |
| 语言: | English |
| 出版: |
Kuala Lumpur:
Kulliyyah of Engineering, International Islamic University Malaysia,
2013
|
| 主题: | |
| 在线阅读: | Click here to view 1st 24 pages of the thesis. Members can view fulltext at the specified PCs in the library. |
| 标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
成为第一个发表评论!