Modelling of the reliability baseline for process control monitoring of kerf structures /
Miniaturization of Metal-Oxide-Semiconductor Field Effect Transistors (MOSFET) beyond 0.1 μm has caused problems like short channel effect and leakage current which has lead to reliability issues. Therefore, reliability monitoring for miniaturized MOSFET is crucial in today's semiconductor indu...
Saved in:
主要作者: | Ismah Binti Izuddin |
---|---|
格式: | Thesis |
语言: | English |
出版: |
Kuala Lumpur:
Kulliyyah of Engineering, International Islamic University Malaysia,
2012
|
主题: | |
在线阅读: | http://studentrepo.iium.edu.my/handle/123456789/5000 |
标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
相似书籍
-
Some new approaches to determining Bayesian reliability demonstration test plan /
由: Ten, Lin Mei
出版: (1998) -
Analysis and applications of software reliability models /
由: Yang, Bo
出版: (2001) -
Software reliability analysis and its applications /
由: Hong, Guanyue
出版: (1998) -
Modeling and analysis of constant-stress and step-stress accelerated life tests /
由: Sun, Yesheng
出版: (1995) -
Human reliability analysis in Probabilistic Safety Assessment during the operation of PUSPATI research reactor /
由: Ahmad Hassan Sallehudin Mohd. Sarif