Abubakkar, S. F. O. (2017). Electron radiation effects on threshold voltage and drain current characteristics of commercial power metal oxide semiconductor devices. Kulliyyah of Engineering, International Islamic University Malaysia.
Chicago Style (17th ed.) CitationAbubakkar, Sheik Fareed Ookar. Electron Radiation Effects on Threshold Voltage and Drain Current Characteristics of Commercial Power Metal Oxide Semiconductor Devices. Kuala Lumpur: Kulliyyah of Engineering, International Islamic University Malaysia, 2017.
MLA (8th ed.) CitationAbubakkar, Sheik Fareed Ookar. Electron Radiation Effects on Threshold Voltage and Drain Current Characteristics of Commercial Power Metal Oxide Semiconductor Devices. Kulliyyah of Engineering, International Islamic University Malaysia, 2017.