Electron radiation effects on threshold voltage and drain current characteristics of commercial power metal oxide semiconductor devices /

Electron radiation effects on threshold voltage and drain current characteristics of commercial power metal oxide semiconductor devices /

Microelectronic power converters such as buck and boost converters are required to be radiation tolerant to exposure of radiation, including electron radiation because of its significant applications in the satellite and space system. Each components of the buck converter design required to be radia...

Saved in:

書目詳細資料
主要作者:	Abubakkar, Sheik Fareed Ookar (Author)
格式:	Thesis
語言:	English
出版:	Kuala Lumpur : Kulliyyah of Engineering, International Islamic University Malaysia, 2017
主題:	Theses, IIUM local
在線閱讀:	Click here to view 1st 24 pages of the thesis. Members can view fulltext at the specified PCs in the library.
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

相似書籍

An investigation into the electron beam induced current effects on semiconductor materials and devices /
由: Ong, Vincent Keng Sian
出版: (1995)

Commercial SiGe and GaAs as low noise amplifiers (LNA) performance under electron radiation /
由: Youssouf, Abdouraouf Said
出版: (2016)

Electrical and optical characterization of commercial GaN and InGaN LED subjected to electron radiation /
由: Anati Syahirah binti Hedzir
出版: (2017)

The importance of minority carrier lifetime in silicon semiconductor devices /
由: Shamsul Zawal
出版: (1997)

Design of compound semiconductor heterojunction bipolar transistors (HBTs) for improved device performance /
由: Peng, Cai Jun
出版: (1996)

Reliability investigation of MOS devices under high current impulse stressing /
由: Teh, Gim Leong
出版: (1998)

Electrical characterisation of commercial optoelectronics diodes and quantum dot based diodes subjected to neutron radiation /
由: Dhiyauddin Ahmad Fauzi
出版: (2015)

Electrical characterisation of commercial silicon NPN bipolar junction transistors subjected to neutron and gamma radiation /
由: Myo, Min Oo
出版: (2014)

Electrical characterization of 4H silicon carbide Schottky diodes under electron radiation /
由: Ganiyev, Sabuhi
出版: (2015)

Characterization of reticle esd threshold voltage measurement for CMOS semiconductor manufacturing
由: Razman, Harriman
出版: (2022)

Laser processing of III-V semiconductors /
由: Lee, Augustin
出版: (1995)

Methodology of solder paste selection in semiconductor industry /
由: Govindasamy, Subramaniam D.
出版: (1996)

Optical and electrical characterisation of crystalline and amorphous semiconductors /
由: Sunita, S.
出版: (1998)

Study of III-V semiconductor quantum structures /
由: Zhang, Xinhai
出版: (2001)

Structural, electrical and optical characterisation of crystalline and amorphous semiconductors /
由: Vengadaesvaran Balakrishnan
出版: (1999)

Plasmons in types I and II semiconductor multilayered films /
由: Song, Lee Meng
出版: (1988)

Significance of post oxidation annealing (POA) and post metallization annealing (PMA) on the capacitance-voltage characterization of Si3N4 mos capacitor /
由: Rosminazuin binti Ab. Rahim

Correlation of electronic and thermal properties of semiconductor devices /
由: Palaniappn Muthupalaniappan
出版: (1999)

Coherence and frequency stability of semiconductor lasers under cooperation and modulation /
由: Loh, Wei Hung
出版: (2002)

The investigation on the factors that affect the resistance of drain-to-source in semiconductor packaging
由: Chua, King Lee
出版: (2004)

Threshold voltage instability on nitride based localized charge trap non-volatile memory devices
由: Lee, Meng Chuan
出版: (2015)

Study of MBE grown AIInGaAs/AIGaAs quantum wells and their application in semiconductor lasers /
由: Zhang, Zhihe
出版: (1997)

Wearable devices for microwave head diagnostic systems /
由: Mohd Saiful Riza Bashri
出版: (2018)

Design of data acquisition system for device reliability studies /
由: Lim, Soo King
出版: (1992)

New techniques for the characterization of hot-carrier degradation in MOS devices /
由: Leang, Sern Ee
出版: (1997)

Degradation and annealing of electrically-stressed thin oxide in MOS devices /
由: Ng, Wee Thong
出版: (1998)

Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
由: Tan, Suat Eng
出版: (1997)

CMOS design and implementation of sigma-delta analog-to-digital data converter for MEMS devices /
由: Anis Nurashikin Nordin
出版: (2002)

Surface and interface investigations of InSb, GaSb, CdTe, InGaN and GaN epitaxial semiconductor thin films /
由: Li, Kun
出版: (1997)

Monte Carlo device simulator for electron transport in III-V semiconductors /
由: Ng, Sidney Chee Mun
出版: (1993)

Transmission electron microscopy of microstructures produced in processing of silikon semiconductor devices /
由: Jia, Yumin
出版: (2001)

Numerical and experimental studies of backgating in high electron mobility transistors /
由: Lee, Kin Man
出版: (1995)

Process integration issues of self-aligned titanium silicide technology (Ti-Salicide) in deep sub-micron CMOS devices fabrication /
由: Lim, Chong Wee
出版: (1998)

A study of long and short channel NMOSFET on threshold voltage /
由: Norseha Ariffin
出版: (2013)

The influence of a layer of oxide on electromigration performance of Al/Cu/Si metal lines /
由: Koh, David Khar Ann
出版: (1995)

Study on threshold voltage shifts and reliability in PFETs by high-voltage on-state and off-state stress
由: Alias, Nurul Ezaila
出版: (2013)

The structure and electronic properties of new ruthenium complexes with 1-benzoyl-3-(pyridine-2-yl)-1h-pyrazole as potential photosensitiser /
由: Lee, Mark Wun Fui

Standard cell library evaluation and optimization for near-threshold voltage operation
由: Lim, Yang Wei
出版: (2022)

CAD software for semiconductor device modeling
由: Othman, Yasmin
出版: (2004)

Current transformer performance in high voltage and low voltage systems
由: Abd Aziz, Muhammad Khairul Arifin
出版: (2008)

Services hosted by the Perpustakaan Sultan Abdul Samad, Universiti Putra Malaysia with Cooperation MySyL Group