Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs

A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively.

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Bibliographic Details
Main Author: Lee, Jia Keat
Format: Thesis
Published: 2008
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Description
Summary:A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively.