Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs

A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively.

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Bibliographic Details
Main Author:	Lee, Jia Keat
Format:	Thesis
Published:	2008
Subjects:	TK7800-8360 Electronics
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id	my-mmu-ep.1667
record_format	uketd_dc
spelling	my-mmu-ep.16672010-09-23T02:17:05Z Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs 2008-12 Lee, Jia Keat TK7800-8360 Electronics A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively. 2008-12 Thesis http://shdl.mmu.edu.my/1667/ http://myto.perpun.net.my/metoalogin/logina.php masters Multimedia University Research Library
institution	Multimedia University
collection	MMU Institutional Repository
topic	TK7800-8360 Electronics
spellingShingle	TK7800-8360 Electronics Lee, Jia Keat Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs
description	A Test Program(TP) is constantly modified with the aim to reduce test cost. This research aims at revealing the effect of test changes on a microchip TP so that TP enhancement can be performed effectively.
format	Thesis
qualification_level	Master's degree
author	Lee, Jia Keat
author_facet	Lee, Jia Keat
author_sort	Lee, Jia Keat
title	Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs
title_short	Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs
title_full	Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs
title_fullStr	Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs
title_full_unstemmed	Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs
title_sort	mining test path signatures for analysis and improvement of microchip testing programs
granting_institution	Multimedia University
granting_department	Research Library
publishDate	2008
_version_	1747829427580960768

Mining Test Path Signatures For Analysis And Improvement Of Microchip Testing Programs

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