Frontside And Backside Fault Localization Techniques On IC Leakage Failures

This research is established to characterize and compare the techniques in terms of their sensitivity in detecting the fault location in common semiconductor failures.New methods are also proposed as alternative techniques which include the backside emission microscopy and backside liquid crystal th...

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Main Author:	Lau, Chee Kiang
Format:	Thesis
Published:	2011
Subjects:	TK Electrical engineering Electronics Nuclear engineering
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id	my-mmu-ep.3699
record_format	uketd_dc
spelling	my-mmu-ep.36992012-12-18T03:21:54Z Frontside And Backside Fault Localization Techniques On IC Leakage Failures 2011-12 Lau, Chee Kiang TK Electrical engineering. Electronics Nuclear engineering This research is established to characterize and compare the techniques in terms of their sensitivity in detecting the fault location in common semiconductor failures.New methods are also proposed as alternative techniques which include the backside emission microscopy and backside liquid crystal thermography. 2011-12 Thesis http://shdl.mmu.edu.my/3699/ http://vlib.mmu.edu.my/diglib/login/dlusr/login.php masters Multimedia University Faculty of Engineering and Technology
institution	Multimedia University
collection	MMU Institutional Repository
topic	TK Electrical engineering Electronics Nuclear engineering
spellingShingle	TK Electrical engineering Electronics Nuclear engineering Lau, Chee Kiang Frontside And Backside Fault Localization Techniques On IC Leakage Failures
description	This research is established to characterize and compare the techniques in terms of their sensitivity in detecting the fault location in common semiconductor failures.New methods are also proposed as alternative techniques which include the backside emission microscopy and backside liquid crystal thermography.
format	Thesis
qualification_level	Master's degree
author	Lau, Chee Kiang
author_facet	Lau, Chee Kiang
author_sort	Lau, Chee Kiang
title	Frontside And Backside Fault Localization Techniques On IC Leakage Failures
title_short	Frontside And Backside Fault Localization Techniques On IC Leakage Failures
title_full	Frontside And Backside Fault Localization Techniques On IC Leakage Failures
title_fullStr	Frontside And Backside Fault Localization Techniques On IC Leakage Failures
title_full_unstemmed	Frontside And Backside Fault Localization Techniques On IC Leakage Failures
title_sort	frontside and backside fault localization techniques on ic leakage failures
granting_institution	Multimedia University
granting_department	Faculty of Engineering and Technology
publishDate	2011
_version_	1747829545242722304

Frontside And Backside Fault Localization Techniques On IC Leakage Failures

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