Characterization of ZnO composited with peg thin film by using sol-gel spin coating technique / Noorfatin Mohd Nasir

In this study, ZnO composited with PEG thin film via sol-gel spin coating method has been fabricated. The PEG act as the phase change material (PCM). ITO substrate was chosen because of its electrical conductivity and optical transparency. The main objective for this research was to produce ZnO comp...

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Bibliographic Details
Main Author: Mohd Nasir, Noorfatin
Format: Thesis
Language:English
Published: 2019
Subjects:
Online Access:https://ir.uitm.edu.my/id/eprint/102778/1/102778.pdf
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Summary:In this study, ZnO composited with PEG thin film via sol-gel spin coating method has been fabricated. The PEG act as the phase change material (PCM). ITO substrate was chosen because of its electrical conductivity and optical transparency. The main objective for this research was to produce ZnO composited with PEG thin film via solgel spin coating method and to explore the physical, structural, optical and electrical characteristics of ZnO/PEG with the different molarity value of ZnO and PEG. There are three parameter that has been studied which were, percentage of PEG that was varied from 10% until 50% with 0.4M of ZnO. Second, the molarity concentration that was varied from 0.1M until 0.4M with the PEG concentration standardized to 10%. Next, parameter layer configuration and annealing temperature that was varied at 300°C and 400°C. All the solution thin film was deposited with the same spin rotation, and drying time and temperature. Physical, optical, structural, and electrical properties of the deposited thin film were analysed using FESEM, XRD, UV-Vis, and I-V measurement. Referring to the result obtained, the morphology structure of the deposited film changes when percentage of PEG increase, where the uniformity can be observed as the percentage increased. Next, from the morphology of concentration of molarity obtained the spread of particles are less on the thin films. Moreover, the morphology of layer configuration and annealing temperature show that the particle size in the thin films tends to increase with annealing temperature. Besides, transmittance and absorbance behaviour also affected by the percentage of the PEG, and concentration of molarity, similar with the XRD spectra and I-V measurement.