Study the effect of doping process on the PMOS structure using silvaco TCAD tools / Aida Zulia Zulhanip

This paper presents the study on the effect of doping process on the PMOS structure using Silvaco TCAD Tools. This research done by dope the P-type material into the polysilicon to observe the electrical properties and performance of PMOS structure at constant dose concentration of 3.0el I (/cm5) an...

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Main Author: Zulhanip, Aida Zulia
Format: Thesis
Language:English
Published: 2007
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Online Access:https://ir.uitm.edu.my/id/eprint/102925/1/102925.pdf
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spelling my-uitm-ir.1029252024-11-12T08:43:58Z Study the effect of doping process on the PMOS structure using silvaco TCAD tools / Aida Zulia Zulhanip 2007 Zulhanip, Aida Zulia Application software This paper presents the study on the effect of doping process on the PMOS structure using Silvaco TCAD Tools. This research done by dope the P-type material into the polysilicon to observe the electrical properties and performance of PMOS structure at constant dose concentration of 3.0el I (/cm5) and temperature to 950 °C using Silvaco TCAD Tools Software. By choosing the P-type materials such as Boron and Gallium, the result due to electrical performance will be appearing in the graph of ID versus VG and Id versus VD graph in Atlas Device Simulation. To study the material penetration and depletion, the graph of concentration (/cm3) versus depth (p.m) will be shown in Tony plot structure. Both of these results are needed to compare the suitable materials used in conducting electricity of PMOS. Dopant material doped in polysilicon will provide the advantage of a good ohmic contact with the wafer silicon and can be oxidized to form an insulating layer. 2007 Thesis https://ir.uitm.edu.my/id/eprint/102925/ https://ir.uitm.edu.my/id/eprint/102925/1/102925.pdf text en public degree Universiti Teknologi MARA (UiTM) Faculty of Electrical Engineering
institution Universiti Teknologi MARA
collection UiTM Institutional Repository
language English
topic Application software
spellingShingle Application software
Zulhanip, Aida Zulia
Study the effect of doping process on the PMOS structure using silvaco TCAD tools / Aida Zulia Zulhanip
description This paper presents the study on the effect of doping process on the PMOS structure using Silvaco TCAD Tools. This research done by dope the P-type material into the polysilicon to observe the electrical properties and performance of PMOS structure at constant dose concentration of 3.0el I (/cm5) and temperature to 950 °C using Silvaco TCAD Tools Software. By choosing the P-type materials such as Boron and Gallium, the result due to electrical performance will be appearing in the graph of ID versus VG and Id versus VD graph in Atlas Device Simulation. To study the material penetration and depletion, the graph of concentration (/cm3) versus depth (p.m) will be shown in Tony plot structure. Both of these results are needed to compare the suitable materials used in conducting electricity of PMOS. Dopant material doped in polysilicon will provide the advantage of a good ohmic contact with the wafer silicon and can be oxidized to form an insulating layer.
format Thesis
qualification_level Bachelor degree
author Zulhanip, Aida Zulia
author_facet Zulhanip, Aida Zulia
author_sort Zulhanip, Aida Zulia
title Study the effect of doping process on the PMOS structure using silvaco TCAD tools / Aida Zulia Zulhanip
title_short Study the effect of doping process on the PMOS structure using silvaco TCAD tools / Aida Zulia Zulhanip
title_full Study the effect of doping process on the PMOS structure using silvaco TCAD tools / Aida Zulia Zulhanip
title_fullStr Study the effect of doping process on the PMOS structure using silvaco TCAD tools / Aida Zulia Zulhanip
title_full_unstemmed Study the effect of doping process on the PMOS structure using silvaco TCAD tools / Aida Zulia Zulhanip
title_sort study the effect of doping process on the pmos structure using silvaco tcad tools / aida zulia zulhanip
granting_institution Universiti Teknologi MARA (UiTM)
granting_department Faculty of Electrical Engineering
publishDate 2007
url https://ir.uitm.edu.my/id/eprint/102925/1/102925.pdf
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