APA引文

Baharom, A. H. (2010). Investigation of shallow trench isolation and silicide effect on 90nm CMOS devices / Abu Hudzaifah Baharom.

Chicago Style (17th ed.) Citation

Baharom, Abu Hudzaifah. Investigation of Shallow Trench Isolation and Silicide Effect on 90nm CMOS Devices / Abu Hudzaifah Baharom. 2010.

MLA引文

Baharom, Abu Hudzaifah. Investigation of Shallow Trench Isolation and Silicide Effect on 90nm CMOS Devices / Abu Hudzaifah Baharom. 2010.

警告：这些引文格式不一定是100％准确.