APA引文

Sevamalai, V. K. (1998). Neural Network Based Pattern Recognition in Visual Inspection System for Intergrated Circuit Mark Inspection.

Chicago Style (17th ed.) Citation

Sevamalai, Venantius Kumar. Neural Network Based Pattern Recognition in Visual Inspection System for Intergrated Circuit Mark Inspection. 1998.

MLA引文

Sevamalai, Venantius Kumar. Neural Network Based Pattern Recognition in Visual Inspection System for Intergrated Circuit Mark Inspection. 1998.

警告：這些引文格式不一定是100％准確.