Neural Network Based Pattern Recognition in Visual Inspection System for Intergrated Circuit Mark Inspection
Industrial visual machine inspection system uses template or feature matching methods to locate or inspect parts or pattern on parts. These algorithms could not compensate for the change or variation on the inspected parts dynamically. Such problem was faced by a multinational semiconductor manuf...
Saved in:
主要作者: | Sevamalai, Venantius Kumar |
---|---|
格式: | Thesis |
語言: | English English |
出版: |
1998
|
主題: | |
在線閱讀: | http://psasir.upm.edu.my/id/eprint/10131/1/FK_1998_8_A.pdf |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Rough Neural Networks Architecture For Improving Generalization In Pattern Recognition
由: Ali Adlan, Hanan Hassan
出版: (2004) -
Speaker Independent Speech Recognition Using Neural Network
由: Tan, Chin Luh
出版: (2004) -
Automated visual inspection of printed circuit boards /
由: Ashbollah Abdul Aziz
出版: (1997) -
Invariant pattern recognition using higher order neural networks /
由: Sivaguru S.
出版: (2001) -
Design and development of neural-fuzzy based microchip inspection system /
由: Hawari, Yasser
出版: (2008)