Neural Network Based Pattern Recognition in Visual Inspection System for Intergrated Circuit Mark Inspection

Industrial visual machine inspection system uses template or feature matching methods to locate or inspect parts or pattern on parts. These algorithms could not compensate for the change or variation on the inspected parts dynamically. Such problem was faced by a multinational semiconductor manuf...

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書目詳細資料
主要作者: Sevamalai, Venantius Kumar
格式: Thesis
語言:English
English
出版: 1998
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在線閱讀:http://psasir.upm.edu.my/id/eprint/10131/1/FK_1998_8_A.pdf
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