APA引文

Kooh, R. J. C. (2000). Device Characterization of 0.8-µm CMOS Technology.

Chicago Style (17th ed.) Citation

Kooh, Roy Jinn Chye. Device Characterization of 0.8-µm CMOS Technology. 2000.

MLA引文

Kooh, Roy Jinn Chye. Device Characterization of 0.8-µm CMOS Technology. 2000.

警告：这些引文格式不一定是100％准确.