Time-Resolved Characteristics of Soft X-Ray and Hard X-Ray Emitted from Nitrogen and Neon Gas Mixtures in 4 kJ Plasma Focus Device

Plasma focus (PF) is a pulsed plasma producing device which consists of two coaxial electrodes separated by an insulator sleeve, a vacuum chamber filled with working gas at low pressure, and an electrical circuitry. Upon discharging a capacitor bank, a plasma column is created in nanosecond rise tim...

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Main Author:	Roomi, Afshin
Format:	Thesis
Language:	English English
Published:	2011
Subjects:	Grenz rays Dense plasma focus Nitrogen
Online Access:	http://psasir.upm.edu.my/id/eprint/19931/2/FS_2011_44_ir.pdf
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id	my-upm-ir.19931
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spelling	my-upm-ir.199312014-01-03T07:24:04Z Time-Resolved Characteristics of Soft X-Ray and Hard X-Ray Emitted from Nitrogen and Neon Gas Mixtures in 4 kJ Plasma Focus Device 2011-09 Roomi, Afshin Plasma focus (PF) is a pulsed plasma producing device which consists of two coaxial electrodes separated by an insulator sleeve, a vacuum chamber filled with working gas at low pressure, and an electrical circuitry. Upon discharging a capacitor bank, a plasma column is created in nanosecond rise time. The Lorentz force accelerates the plasma sheath along the anode towards the anode tip and compressed magnetically to form a dense plasma column. As a result of electrons interaction with atoms of the anode and working gas, Soft X-rays (SXR) and hard X-rays (HXR) are produced. The effects of applied voltage, operating pressure and working gas composition on SXR and HXR emitted from a 4 kJ plasma focus device which is called ‘APF’ have been investigated. Nitrogen (N2) and Nitrogen: Neon (N2: Ne) admixture with three volumetric ratios of (90: 10), (75: 25), and (50: 50) were used as the working gas in order to study the effect of gas composition on X-ray emission from the device. To investigate the effect of applied voltage and operating pressure on the behavior of SXR and HXR emissions, four voltages of 10, 11, 12, and 13 kV with a range of pressures of 1.5, 2, 2.5, 3, 3.5, 4,4.5, and 5 torr were applied. The diagnostic devices employed during the experiments were a scintillation detector for HXR detection, an array of five filtered PIN-diodes for SXR detection with different energies, a Pin-hole camera with two different filtered apertures for analyzing the dense plasma column, a Rogowski coil for measuring the discharge current, a voltage probe to measure the tube voltage and four oscilloscopes for getting the signals obtained by the different detectors. The results of HXR signals obtained by the scintillation detector showed that the intensity of HXR decreases with an increase of neon gas in the working gas admixture. On the other hand the signals obtained by three PIN-diodes filtered by Al + Mylar (12μm), Al + Mylar (24 μm), and Be (230 μm) which were for SXR, illustrated that the intensity of SXR increases with an increase of neon percentage in the admixture. Also the signals detected by two PINdiodes covered by Al + Mylar (150 μm), and Cu (10 μm) which are for HXR, were in agreement with the results of the scintillation detector. For all compositions of the working gases, it was observed that the intensity of both SXR and HXR increased with increase of the applied voltage. For applied voltages used on every working gas, the optimum pressures for maximum intensity of SXR and HXR emitted were obtained. The results showed that the optimum conditions for maximum emissions of SXR and HXR using nitrogen (N2) and neon (Ne) mixture are different. Therefore, it was found that the APF is in the optimum condition either for SXR or HXR emission. Our results concluded that the mixing neon (Ne) and nitrogen (N2) as the working gas in the APF is a power source of SXR emission. Grenz rays Dense plasma focus Nitrogen 2011-09 Thesis http://psasir.upm.edu.my/id/eprint/19931/ http://psasir.upm.edu.my/id/eprint/19931/2/FS_2011_44_ir.pdf application/pdf en public phd doctoral Universiti Putra Malaysia Grenz rays Dense plasma focus Nitrogen Faculty of Science English
institution	Universiti Putra Malaysia
collection	PSAS Institutional Repository
language	English English
topic	Grenz rays Dense plasma focus Nitrogen
spellingShingle	Grenz rays Dense plasma focus Nitrogen Roomi, Afshin Time-Resolved Characteristics of Soft X-Ray and Hard X-Ray Emitted from Nitrogen and Neon Gas Mixtures in 4 kJ Plasma Focus Device
description	Plasma focus (PF) is a pulsed plasma producing device which consists of two coaxial electrodes separated by an insulator sleeve, a vacuum chamber filled with working gas at low pressure, and an electrical circuitry. Upon discharging a capacitor bank, a plasma column is created in nanosecond rise time. The Lorentz force accelerates the plasma sheath along the anode towards the anode tip and compressed magnetically to form a dense plasma column. As a result of electrons interaction with atoms of the anode and working gas, Soft X-rays (SXR) and hard X-rays (HXR) are produced. The effects of applied voltage, operating pressure and working gas composition on SXR and HXR emitted from a 4 kJ plasma focus device which is called ‘APF’ have been investigated. Nitrogen (N2) and Nitrogen: Neon (N2: Ne) admixture with three volumetric ratios of (90: 10), (75: 25), and (50: 50) were used as the working gas in order to study the effect of gas composition on X-ray emission from the device. To investigate the effect of applied voltage and operating pressure on the behavior of SXR and HXR emissions, four voltages of 10, 11, 12, and 13 kV with a range of pressures of 1.5, 2, 2.5, 3, 3.5, 4,4.5, and 5 torr were applied. The diagnostic devices employed during the experiments were a scintillation detector for HXR detection, an array of five filtered PIN-diodes for SXR detection with different energies, a Pin-hole camera with two different filtered apertures for analyzing the dense plasma column, a Rogowski coil for measuring the discharge current, a voltage probe to measure the tube voltage and four oscilloscopes for getting the signals obtained by the different detectors. The results of HXR signals obtained by the scintillation detector showed that the intensity of HXR decreases with an increase of neon gas in the working gas admixture. On the other hand the signals obtained by three PIN-diodes filtered by Al + Mylar (12μm), Al + Mylar (24 μm), and Be (230 μm) which were for SXR, illustrated that the intensity of SXR increases with an increase of neon percentage in the admixture. Also the signals detected by two PINdiodes covered by Al + Mylar (150 μm), and Cu (10 μm) which are for HXR, were in agreement with the results of the scintillation detector. For all compositions of the working gases, it was observed that the intensity of both SXR and HXR increased with increase of the applied voltage. For applied voltages used on every working gas, the optimum pressures for maximum intensity of SXR and HXR emitted were obtained. The results showed that the optimum conditions for maximum emissions of SXR and HXR using nitrogen (N2) and neon (Ne) mixture are different. Therefore, it was found that the APF is in the optimum condition either for SXR or HXR emission. Our results concluded that the mixing neon (Ne) and nitrogen (N2) as the working gas in the APF is a power source of SXR emission.
format	Thesis
qualification_name	Doctor of Philosophy (PhD.)
qualification_level	Doctorate
author	Roomi, Afshin
author_facet	Roomi, Afshin
author_sort	Roomi, Afshin
title	Time-Resolved Characteristics of Soft X-Ray and Hard X-Ray Emitted from Nitrogen and Neon Gas Mixtures in 4 kJ Plasma Focus Device
title_short	Time-Resolved Characteristics of Soft X-Ray and Hard X-Ray Emitted from Nitrogen and Neon Gas Mixtures in 4 kJ Plasma Focus Device
title_full	Time-Resolved Characteristics of Soft X-Ray and Hard X-Ray Emitted from Nitrogen and Neon Gas Mixtures in 4 kJ Plasma Focus Device
title_fullStr	Time-Resolved Characteristics of Soft X-Ray and Hard X-Ray Emitted from Nitrogen and Neon Gas Mixtures in 4 kJ Plasma Focus Device
title_full_unstemmed	Time-Resolved Characteristics of Soft X-Ray and Hard X-Ray Emitted from Nitrogen and Neon Gas Mixtures in 4 kJ Plasma Focus Device
title_sort	time-resolved characteristics of soft x-ray and hard x-ray emitted from nitrogen and neon gas mixtures in 4 kj plasma focus device
granting_institution	Universiti Putra Malaysia
granting_department	Faculty of Science
publishDate	2011
url	http://psasir.upm.edu.my/id/eprint/19931/2/FS_2011_44_ir.pdf
_version_	1747811452046016512

Time-Resolved Characteristics of Soft X-Ray and Hard X-Ray Emitted from Nitrogen and Neon Gas Mixtures in 4 kJ Plasma Focus Device

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