Development Of Software System For Detecting Defective Symbol On IC Chip Using Matrox Imaging Library
In semiconductor fabrication process, symbol or label inspection is one of the main processes that needs to be considered seriously. Errors may occur during the printing process of label or name on the integrated circuit chip (IC). If this occurs, the IC chip may have a wrong name. This will affe...
Saved in:
| 主要作者: | |
|---|---|
| 格式: | Thesis |
| 语言: | English |
| 出版: |
2004
|
| 主题: | |
| 在线阅读: | http://psasir.upm.edu.my/id/eprint/5945/1/FK_2004_49%20IR.pdf |
| 标签: |
添加标签
没有标签, 成为第一个标记此记录!
|