Deterministic Automatic Test Pattern Generation for Built-In Self Test System
With a great growing use of electronic products in many aspects of society, it is evident that these products must perform reliably. Their reliability depends on the testing whether or not they have been manufactured properly and behave correctly. To ease testing, digital systems are commonly design...
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| 主要作者: | |
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| 格式: | Thesis |
| 语言: | English |
| 出版: |
2006
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| 在线阅读: | http://psasir.upm.edu.my/id/eprint/655/1/600530_FK_2006_53.pdf |
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