Software Modification in a Fault Analysis Tool for Critical Path Debugging

Microprocessor units caught with speed failure are becoming more and more eminent as the fabrication process shrinks according to Moore’s Law. Failure Analysis (FA) engineers confront the problem using Critical Path Debug method utilizing special IC (Integrated Circuit) test system capable of tes...

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主要作者: Han, Chung Dean
格式: Thesis
语言:English
English
出版: 2009
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在线阅读:http://psasir.upm.edu.my/id/eprint/7360/1/FK_2009_50a.pdf
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