Fault Isolation with ‘X’ Filter for Bogus Signals and Intensive Scan Cell Sequence Validation
There are some concerns in silicon data collection by using the Design-For-Test (DFT). Bogus signal which carries ‘x’ value in simulation, results from the complex logic synthesis and power-up floating state can often mislead the fault isolation process with invalid failing condition. Besides, scan...
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| 主要作者: | |
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| 格式: | Thesis |
| 语言: | English |
| 出版: |
2017
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| 在线阅读: | http://eprints.usm.my/39412/1/Khor_Wooi_Kin_24_Pages.pdf |
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