Scan Test Coverage Improvement Via Automatic Test Pattern Generation (Atpg) Tool Configuration
The scan test coverage improvement by using automatic test pattern generation (ATPG) tool configuration was investigated. Improving the test coverage is essential in detecting manufacturing defects in semiconductor industry so that high quality products can be supplied to consumers. The ATPG tool us...
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| 主要作者: | |
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| 格式: | Thesis |
| 语言: | English |
| 出版: |
2017
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| 主题: | |
| 在线阅读: | http://eprints.usm.my/39652/1/MUHAMMAD_REDZWAN_BIN_SALEHUDDIN_24_Pages.pdf |
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