Development Of Test Platform Of Fpga Interconnect To Capture Marginal Open Defect
This research highlights the development of test platform of FPGA interconnect to capture marginal open defect on Altera® Stratix V devices. The need for at-speed test was due to the increasing number of marginal open defects, resulting from manufacturing process complexity anticipated from continu...
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| 格式: | Thesis |
| 语言: | English |
| 出版: |
2015
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| 主题: | |
| 在线阅读: | http://eprints.usm.my/40813/1/FAHMY_HAFRIZ_BIN_MOHAMED_SULTAN_24_pages.pdf |
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