Development Of Laser Assisted Device Alteration (Lada) Technique For Failure Region Identification In Integrated Circuit
The purpose of this research is to create a solution for some of the obstacles faced during Integrated Circuit (IC) Failure Analysis (FA). Faults in ICs increase proportionally with the growing number of transistors, narrower process margins and increasing complexity of IC design. The IC industry de...
Saved in:
| 主要作者: | |
|---|---|
| 格式: | Thesis |
| 语言: | English |
| 出版: |
2015
|
| 主题: | |
| 在线阅读: | http://eprints.usm.my/40968/1/THOR_MAN_HON_24_pages.pdf |
| 标签: |
添加标签
没有标签, 成为第一个标记此记录!
|