Development Of Laser Assisted Device Alteration (Lada) Technique For Failure Region Identification In Integrated Circuit

Development Of Laser Assisted Device Alteration (Lada) Technique For Failure Region Identification In Integrated Circuit

The purpose of this research is to create a solution for some of the obstacles faced during Integrated Circuit (IC) Failure Analysis (FA). Faults in ICs increase proportionally with the growing number of transistors, narrower process margins and increasing complexity of IC design. The IC industry de...

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书目详细资料
主要作者:	Thor , Man Hon
格式:	Thesis
语言:	English
出版:	2015
主题:	TK7800-8360 Electronics
在线阅读:	http://eprints.usm.my/40968/1/THOR_MAN_HON_24_pages.pdf
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