Defect Detection And Classification Of Silicon Solar Wafer Featuring Nir Imaging And Improved Niblack Segmentation
Menghasilkan tenaga yang boleh diperbaharui berkuantiti tinggi memerlukan kecekapan yang tinggi dalam fabrikasi produk wafer silikon, yang juga merupakan komponen asas panel solar. Oleh yang demikian, pemeriksaan kualiti yang tinggi untuk wafer solar semasa proses pengeluaran sangat penting. Dala...
Saved in:
主要作者: | Mahdavipour, Zeinab |
---|---|
格式: | Thesis |
語言: | English |
出版: |
2016
|
主題: | |
在線閱讀: | http://eprints.usm.my/41026/1/Defect_Detection_And_Classification_Of_Silicon_Solar_Wafer_Featuring_Nir_Imaging_And_Improved_Niblack_Segmentation.pdf |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
相似書籍
-
Optical Scattering Detection And Characterisation Of Crystal Originated Particles In Czochralski-Grown Silicon Wafers
由: Lee , Wah Pheng
出版: (2005) -
Effect Of Temperature And Electric Field On Polysilicon Gettering Of Copper Impurities In Silicon Wafer
由: Choong, Chwee Lin
出版: (2006) -
Electric-field enhanced diffusion and polysilicon gettering of copper and iron in silicon wafer
由: Koh, Song Foo
出版: (2014) -
Study Of The Interaction Between The Functions Of Grit Size And Residual Damage Of An Ultra Thin Wafer
由: Cheong, Yew Wee
出版: (2002) -
Applicability Of Analytical Model For Modeling Silicon And Silicon Carbide MOS Transistors
由: Lock, Choon Hou
出版: (2006)