On-wafer noise figure characterization for radio frequency integrated circuits.

Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figu...

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Main Author: Mohd, Shukri Korakkottil Kunhi
Format: Thesis
Language:English
Published: 2011
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Online Access:http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf
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spelling my-usm-ep.411032018-07-26T06:51:07Z On-wafer noise figure characterization for radio frequency integrated circuits. 2011-03 Mohd, Shukri Korakkottil Kunhi TK1-9971 Electrical engineering. Electronics. Nuclear engineering Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF. 2011-03 Thesis http://eprints.usm.my/41103/ http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Kejuruteraan Elektrik Dan Elektronik
institution Universiti Sains Malaysia
collection USM Institutional Repository
language English
topic TK1-9971 Electrical engineering
Electronics
Nuclear engineering
spellingShingle TK1-9971 Electrical engineering
Electronics
Nuclear engineering
Mohd, Shukri Korakkottil Kunhi
On-wafer noise figure characterization for radio frequency integrated circuits.
description Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF.
format Thesis
qualification_level Master's degree
author Mohd, Shukri Korakkottil Kunhi
author_facet Mohd, Shukri Korakkottil Kunhi
author_sort Mohd, Shukri Korakkottil Kunhi
title On-wafer noise figure characterization for radio frequency integrated circuits.
title_short On-wafer noise figure characterization for radio frequency integrated circuits.
title_full On-wafer noise figure characterization for radio frequency integrated circuits.
title_fullStr On-wafer noise figure characterization for radio frequency integrated circuits.
title_full_unstemmed On-wafer noise figure characterization for radio frequency integrated circuits.
title_sort on-wafer noise figure characterization for radio frequency integrated circuits.
granting_institution Universiti Sains Malaysia
granting_department Pusat Pengajian Kejuruteraan Elektrik Dan Elektronik
publishDate 2011
url http://eprints.usm.my/41103/1/On-wafer_noise_figure_characterization_for_radio_frequency_integrated_circuits..pdf
_version_ 1747820875584897024