Effect Of Lanthanum Dopant On The Properties Of Cacu3ti4o12 Thin Films Synthesized By Sol-Gel Method

The CaCu3Ti4O12 (CCTO) was discovered to possess high dielectric constants, ɛ ~ 104 at low frequencies. The undoped and La doped CCTO thin films were prepared by sol-gel method. The raw materials of Ca(CH3COO)2, Cu(C2H3O2)2.H2O, Ti[OCH(CH3)2]4, were used to produce undoped CCTO thin films, whereas L...

Full description

Saved in:

Bibliographic Details
Main Author:	Ahmad, Nurul Nasuha
Format:	Thesis
Language:	English
Published:	2012
Subjects:	TA404 Composite materials
Online Access:	http://eprints.usm.my/41218/1/NURUL_NASUHA_BINTI_AHMAD_24_Pages.pdf
Tags:	Add Tag No Tags, Be the first to tag this record!

id	my-usm-ep.41218
record_format	uketd_dc
spelling	my-usm-ep.412182018-07-31T08:48:28Z Effect Of Lanthanum Dopant On The Properties Of Cacu3ti4o12 Thin Films Synthesized By Sol-Gel Method 2012 Ahmad, Nurul Nasuha TA404 Composite materials The CaCu3Ti4O12 (CCTO) was discovered to possess high dielectric constants, ɛ ~ 104 at low frequencies. The undoped and La doped CCTO thin films were prepared by sol-gel method. The raw materials of Ca(CH3COO)2, Cu(C2H3O2)2.H2O, Ti[OCH(CH3)2]4, were used to produce undoped CCTO thin films, whereas La(NO3)3.6H2O was used as dopant source to form La-doped CCTO (Ca1-xLaxCu3Ti4O12) with x = 0.01, 0.02, 0.05 and 0.10. The sol-gel solution was heated for two and half hours at 110 °C and then deposited on the p type Si wafer using spin coating process. The dried films were annealed using two stages of annealing process at 500 °C for 10 minutes and followed by at 900 °C for 1 hour. The phase formation of the CCTO was identified by X-ray diffraction (XRD) and the microstructure observed by field emission scanning electron microscope (FESEM). The elemental composition of prepared CCTO thin films was identified by using energy dispersive X-ray (EDX). The topography and the phase imaging of the samples were obtained using atomic force microscopy (AFM) by scanning area of 10 μm x 10 μm. The semiconductor parameter analyzer (SPA) was used to measure the current-voltage (I-V) and capacitance-voltage (C-V) characteristics. The samples were coated with silver electrodes for electrical and dielectric properties measurement. The formation of CCTO compound was confirmed by XRD with some minor peaks of CuO and TiO2 co-exist in CCTO thin films. The grains size is in between 38 nm to 205 nm measured by SEM. The EDX analysis confirmed the chemical element of CCTO exist in the thin films. The AFM analysis confirmed no significant secondary phase observed from the phase imaging of the film surface. Sample doped with 2 at% La give better electrical conductivity. The La dopant shows improvement on the dielectric properties of the CCTO with 2 at% La give optimum dielectric value. 2012 Thesis http://eprints.usm.my/41218/ http://eprints.usm.my/41218/1/NURUL_NASUHA_BINTI_AHMAD_24_Pages.pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Kejuruteraan Bahan dan Sumber Mineral
institution	Universiti Sains Malaysia
collection	USM Institutional Repository
language	English
topic	TA404 Composite materials
spellingShingle	TA404 Composite materials Ahmad, Nurul Nasuha Effect Of Lanthanum Dopant On The Properties Of Cacu3ti4o12 Thin Films Synthesized By Sol-Gel Method
description	The CaCu3Ti4O12 (CCTO) was discovered to possess high dielectric constants, ɛ ~ 104 at low frequencies. The undoped and La doped CCTO thin films were prepared by sol-gel method. The raw materials of Ca(CH3COO)2, Cu(C2H3O2)2.H2O, Ti[OCH(CH3)2]4, were used to produce undoped CCTO thin films, whereas La(NO3)3.6H2O was used as dopant source to form La-doped CCTO (Ca1-xLaxCu3Ti4O12) with x = 0.01, 0.02, 0.05 and 0.10. The sol-gel solution was heated for two and half hours at 110 °C and then deposited on the p type Si wafer using spin coating process. The dried films were annealed using two stages of annealing process at 500 °C for 10 minutes and followed by at 900 °C for 1 hour. The phase formation of the CCTO was identified by X-ray diffraction (XRD) and the microstructure observed by field emission scanning electron microscope (FESEM). The elemental composition of prepared CCTO thin films was identified by using energy dispersive X-ray (EDX). The topography and the phase imaging of the samples were obtained using atomic force microscopy (AFM) by scanning area of 10 μm x 10 μm. The semiconductor parameter analyzer (SPA) was used to measure the current-voltage (I-V) and capacitance-voltage (C-V) characteristics. The samples were coated with silver electrodes for electrical and dielectric properties measurement. The formation of CCTO compound was confirmed by XRD with some minor peaks of CuO and TiO2 co-exist in CCTO thin films. The grains size is in between 38 nm to 205 nm measured by SEM. The EDX analysis confirmed the chemical element of CCTO exist in the thin films. The AFM analysis confirmed no significant secondary phase observed from the phase imaging of the film surface. Sample doped with 2 at% La give better electrical conductivity. The La dopant shows improvement on the dielectric properties of the CCTO with 2 at% La give optimum dielectric value.
format	Thesis
qualification_level	Master's degree
author	Ahmad, Nurul Nasuha
author_facet	Ahmad, Nurul Nasuha
author_sort	Ahmad, Nurul Nasuha
title	Effect Of Lanthanum Dopant On The Properties Of Cacu3ti4o12 Thin Films Synthesized By Sol-Gel Method
title_short	Effect Of Lanthanum Dopant On The Properties Of Cacu3ti4o12 Thin Films Synthesized By Sol-Gel Method
title_full	Effect Of Lanthanum Dopant On The Properties Of Cacu3ti4o12 Thin Films Synthesized By Sol-Gel Method
title_fullStr	Effect Of Lanthanum Dopant On The Properties Of Cacu3ti4o12 Thin Films Synthesized By Sol-Gel Method
title_full_unstemmed	Effect Of Lanthanum Dopant On The Properties Of Cacu3ti4o12 Thin Films Synthesized By Sol-Gel Method
title_sort	effect of lanthanum dopant on the properties of cacu3ti4o12 thin films synthesized by sol-gel method
granting_institution	Universiti Sains Malaysia
granting_department	Pusat Pengajian Kejuruteraan Bahan dan Sumber Mineral
publishDate	2012
url	http://eprints.usm.my/41218/1/NURUL_NASUHA_BINTI_AHMAD_24_Pages.pdf
_version_	1747820890021691392

Effect Of Lanthanum Dopant On The Properties Of Cacu3ti4o12 Thin Films Synthesized By Sol-Gel Method

Similar Items