Highly Accelerated Stress Screening Optimization

Highly Accelerated Stress Screening (HASS) a popular method used by many manufacturing facilities to screen process defects. HASS testing comprises of two phases – (i) precipitation and (ii) detection. The detection includes a functional test at various temperature values and vibration test at 6-deg...

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Main Author: Jamadin, Nor Hasnifarina
Format: Thesis
Language:English
Published: 2016
Subjects:
Online Access:http://eprints.usm.my/41325/1/NOR_HASNIFARINA_BINTI_JAMADIN_24_Pages.pdf
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spelling my-usm-ep.413252018-08-14T08:24:30Z Highly Accelerated Stress Screening Optimization 2016 Jamadin, Nor Hasnifarina TK7800-8360 Electronics Highly Accelerated Stress Screening (HASS) a popular method used by many manufacturing facilities to screen process defects. HASS testing comprises of two phases – (i) precipitation and (ii) detection. The detection includes a functional test at various temperature values and vibration test at 6-degree of freedom. Primary actuator control electronic (PACE) product has high customer returns due to product failure at different temperature in the field. Therefore, this research investigates the compliance in temperature profile used for PACE testing with HASS standard. Proof of Screen (POS) and data collection have shown that product control HASS testing resulted in accurate outcome. A further improvement from 2-16 % in temperature profile is achieved via process control. Process-control improved screen effectiveness to the product by minimizing the error to the set point limit. Mean Square Error (MSE), Normalize Cross Correlation (NCC), and statistical analysis tools are used to verify the process-control improvement profile result. MSE shows that improvement around 5% in minimizing the error and NCC improvement shows around 3% and 19.5% for detection and precipitation phases respectively. 2016 Thesis http://eprints.usm.my/41325/ http://eprints.usm.my/41325/1/NOR_HASNIFARINA_BINTI_JAMADIN_24_Pages.pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Kejuruteraan Elektrik dan Elektronik
institution Universiti Sains Malaysia
collection USM Institutional Repository
language English
topic TK7800-8360 Electronics
spellingShingle TK7800-8360 Electronics
Jamadin, Nor Hasnifarina
Highly Accelerated Stress Screening Optimization
description Highly Accelerated Stress Screening (HASS) a popular method used by many manufacturing facilities to screen process defects. HASS testing comprises of two phases – (i) precipitation and (ii) detection. The detection includes a functional test at various temperature values and vibration test at 6-degree of freedom. Primary actuator control electronic (PACE) product has high customer returns due to product failure at different temperature in the field. Therefore, this research investigates the compliance in temperature profile used for PACE testing with HASS standard. Proof of Screen (POS) and data collection have shown that product control HASS testing resulted in accurate outcome. A further improvement from 2-16 % in temperature profile is achieved via process control. Process-control improved screen effectiveness to the product by minimizing the error to the set point limit. Mean Square Error (MSE), Normalize Cross Correlation (NCC), and statistical analysis tools are used to verify the process-control improvement profile result. MSE shows that improvement around 5% in minimizing the error and NCC improvement shows around 3% and 19.5% for detection and precipitation phases respectively.
format Thesis
qualification_level Master's degree
author Jamadin, Nor Hasnifarina
author_facet Jamadin, Nor Hasnifarina
author_sort Jamadin, Nor Hasnifarina
title Highly Accelerated Stress Screening Optimization
title_short Highly Accelerated Stress Screening Optimization
title_full Highly Accelerated Stress Screening Optimization
title_fullStr Highly Accelerated Stress Screening Optimization
title_full_unstemmed Highly Accelerated Stress Screening Optimization
title_sort highly accelerated stress screening optimization
granting_institution Universiti Sains Malaysia
granting_department Pusat Pengajian Kejuruteraan Elektrik dan Elektronik
publishDate 2016
url http://eprints.usm.my/41325/1/NOR_HASNIFARINA_BINTI_JAMADIN_24_Pages.pdf
_version_ 1747820911590899712