APA引文

Shanmugam, R. (2015). 20-Gbps High-Speed Converged I/O Loop Back Test Design Methodology For Signal Integrity Enhancement.

Chicago Style (17th ed.) Citation

Shanmugam, Ragubalan. 20-Gbps High-Speed Converged I/O Loop Back Test Design Methodology For Signal Integrity Enhancement. 2015.

MLA引文

Shanmugam, Ragubalan. 20-Gbps High-Speed Converged I/O Loop Back Test Design Methodology For Signal Integrity Enhancement. 2015.

警告：这些引文格式不一定是100％准确.