Fabrication Of Gold Nanodot On Silicon Substrate By Scanning Probe Microscopy And Its Characterization
Penggunaan teknik-teknik berasaskan mikroskop siasat imbasan (SPM) sebagai suatu alat pembuatan dan pencirian telah dilakukan. Mod AFM tak-sentuh yang dioperasikan pada suhu bilik dan di bawah keadaan vakum telah digunakan untuk mendepositkan nanodot emas di atas substrat silikon. Perkara ini dapat...
Saved in:
Main Author: | Darsono, Teguh |
---|---|
Format: | Thesis |
Language: | English |
Published: |
2016
|
Subjects: | |
Online Access: | http://eprints.usm.my/41777/1/Fabrication_Of_Gold_Nanodot_On_Silicon_Substrate_By_Scanning_Probe_Microscopy_And_Its_Characterization.pdf |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Fabrication and characterization of submicrometer structures and devices using soft lithography and scanning probe microscopy /
by: Ng, Hou Tee
Published: (2001) -
Fabrication and characterization of scanning thermal microscopy tips using silicon micromachining technology /
by: Hu, Chang Chuan
Published: (2001) -
Materials characterization and modification with scanning probe techniques /
by: Lei, Zhou
Published: (1998) -
Silicon self - assembled nanodots fabricated using a radio - frequency magnetron sputtering method
by: Lim, Qiao Jie
Published: (2008) -
Silicon self-assembled nanodots fabricated using a radio-frequency magnetron sputtering method
by: Lim, Qiao Jie
Published: (2008)