Design And Characterization Of Silicon Nanowire Transistor And Logic Nanowire Inverter Circuits
The most important limitation in planer MOSFETs is current leakage between the source and the drain at the off-state (IOFF), which presents a critical problem in securing circuit reliability. To mitigate this problem, there are new types of transistors with a 3D structure, including silicon na...
Saved in:
主要作者: | |
---|---|
格式: | Thesis |
語言: | English |
出版: |
2013
|
主題: | |
在線閱讀: | http://eprints.usm.my/45223/1/Yasir%20Hashim%20Naif24.pdf |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|