Prediction Of Electrostatic Discharge Soft Error On Two-Way Radio Using Simulation And Immunity Scanning Technique

Electrostatic discharge (ESD) is a major cause of failures and malfunctions in two-way communication radio. Soft error failures like logic error, latch-up and wrong reset can occur as a result of the excessive ESD. It is a well-known fact that the Complementary Metal-Oxide- Semiconductor (CMOS) d...

Full description

Saved in:
Bibliographic Details
Main Author: Antong, Rosnah
Format: Thesis
Language:English
Published: 2017
Subjects:
Online Access:http://eprints.usm.my/46419/1/Prediction%20Of%20Electrostatic%20Discharge%20Soft%20Error%20On%20Two-Way%20Radio%20Using%20Simulation%20And%20Immunity%20Scanning%20Technique.pdf
Tags: Add Tag
No Tags, Be the first to tag this record!
id my-usm-ep.46419
record_format uketd_dc
spelling my-usm-ep.464192021-11-17T03:42:17Z Prediction Of Electrostatic Discharge Soft Error On Two-Way Radio Using Simulation And Immunity Scanning Technique 2017-02-01 Antong, Rosnah T Technology TK1-9971 Electrical engineering. Electronics. Nuclear engineering Electrostatic discharge (ESD) is a major cause of failures and malfunctions in two-way communication radio. Soft error failures like logic error, latch-up and wrong reset can occur as a result of the excessive ESD. It is a well-known fact that the Complementary Metal-Oxide- Semiconductor (CMOS) devices are more susceptible to ESD. The failure of CMOS ICs due to ESD can also cause radio to reset or shutdown completely. Presently the failures are detected after the radio is built and tested only. In this research, new methodology is developed to assess the ESD risk of two-way radio at circuit level. Poynting vector is used to calculate the incident power received by susceptible integrated circuit during ESD. In doing so the two-way radio is modeled in 3-D using the IEC 61000-4-2 standard. The result provides a graphical means to visualize the propagation of ESD current in Printed Circuit Board (PCB) and ground plane. Time-weighted average power density (Stwa) calculated as a cross product between E-field and H-field was used extensively in the modeling, from which a maximum limit of 3.7 W=m2, Stwa was established for predicting ESD failures. It was observed that results obtained through computer simulation agree well with measured values within some tolerance limit. It was also discovered that the improved radio with metal bar is well above this limit compared to the original radio. It is also predicted that the soft error due to ESD would occur at 11 kV and 8 kV for improved and original radio respectively. Results from this study provide a new scheme for engineers to assess ESD risk of two-way radio at PCB level. Identifying most susceptible component to ESD allows radio failures to be addressed adequately before mass production. 2017-02 Thesis http://eprints.usm.my/46419/ http://eprints.usm.my/46419/1/Prediction%20Of%20Electrostatic%20Discharge%20Soft%20Error%20On%20Two-Way%20Radio%20Using%20Simulation%20And%20Immunity%20Scanning%20Technique.pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Kejuruteraan Elektrik & Elektronik
institution Universiti Sains Malaysia
collection USM Institutional Repository
language English
topic T Technology
T Technology
spellingShingle T Technology
T Technology
Antong, Rosnah
Prediction Of Electrostatic Discharge Soft Error On Two-Way Radio Using Simulation And Immunity Scanning Technique
description Electrostatic discharge (ESD) is a major cause of failures and malfunctions in two-way communication radio. Soft error failures like logic error, latch-up and wrong reset can occur as a result of the excessive ESD. It is a well-known fact that the Complementary Metal-Oxide- Semiconductor (CMOS) devices are more susceptible to ESD. The failure of CMOS ICs due to ESD can also cause radio to reset or shutdown completely. Presently the failures are detected after the radio is built and tested only. In this research, new methodology is developed to assess the ESD risk of two-way radio at circuit level. Poynting vector is used to calculate the incident power received by susceptible integrated circuit during ESD. In doing so the two-way radio is modeled in 3-D using the IEC 61000-4-2 standard. The result provides a graphical means to visualize the propagation of ESD current in Printed Circuit Board (PCB) and ground plane. Time-weighted average power density (Stwa) calculated as a cross product between E-field and H-field was used extensively in the modeling, from which a maximum limit of 3.7 W=m2, Stwa was established for predicting ESD failures. It was observed that results obtained through computer simulation agree well with measured values within some tolerance limit. It was also discovered that the improved radio with metal bar is well above this limit compared to the original radio. It is also predicted that the soft error due to ESD would occur at 11 kV and 8 kV for improved and original radio respectively. Results from this study provide a new scheme for engineers to assess ESD risk of two-way radio at PCB level. Identifying most susceptible component to ESD allows radio failures to be addressed adequately before mass production.
format Thesis
qualification_level Master's degree
author Antong, Rosnah
author_facet Antong, Rosnah
author_sort Antong, Rosnah
title Prediction Of Electrostatic Discharge Soft Error On Two-Way Radio Using Simulation And Immunity Scanning Technique
title_short Prediction Of Electrostatic Discharge Soft Error On Two-Way Radio Using Simulation And Immunity Scanning Technique
title_full Prediction Of Electrostatic Discharge Soft Error On Two-Way Radio Using Simulation And Immunity Scanning Technique
title_fullStr Prediction Of Electrostatic Discharge Soft Error On Two-Way Radio Using Simulation And Immunity Scanning Technique
title_full_unstemmed Prediction Of Electrostatic Discharge Soft Error On Two-Way Radio Using Simulation And Immunity Scanning Technique
title_sort prediction of electrostatic discharge soft error on two-way radio using simulation and immunity scanning technique
granting_institution Universiti Sains Malaysia
granting_department Pusat Pengajian Kejuruteraan Elektrik & Elektronik
publishDate 2017
url http://eprints.usm.my/46419/1/Prediction%20Of%20Electrostatic%20Discharge%20Soft%20Error%20On%20Two-Way%20Radio%20Using%20Simulation%20And%20Immunity%20Scanning%20Technique.pdf
_version_ 1747821666621194240