Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range

Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) an...

Full description

Saved in:

Bibliographic Details
Main Author:	Cha, Hong Ye
Format:	Thesis
Language:	English
Published:	2017
Subjects:	T Technology
Online Access:	http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf
Tags:	Add Tag No Tags, Be the first to tag this record!

id	my-usm-ep.46475
record_format	uketd_dc
spelling	my-usm-ep.464752021-11-17T03:42:14Z Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range 2017-08-01 Cha, Hong Ye T Technology TK1-9971 Electrical engineering. Electronics. Nuclear engineering Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) and thru-reflect-line (TRL). Substrate integrated waveguide (SIW) demonstrates low loss, compact size, and ease for integration with the planar circuits. In this research, MTRL calibration is proposed to predict the single- and multilayer- SIW. The analytical modelling of MTRL calibration, and the FE models of the prototypes are discussed and simulated. The S-parameters, such as insertion loss, bandwidth, and resonant frequency, can be measured in the frequency range of 8.0 GHz – 13.0 GHz. The S-parameters of the prototype are measured by the proposed MTRL kits and compared with commercial SOLT kits, and validated by FE results. The comparison results between MTRL, SOLT and FE models for single layer SIW are discussed and analysed. MTRL calibration on single layer SIW shows deviation of 0 % - 5.0 % of centre frequency, larger operating bandwidth and closer insertion loss with respect to FE models. Moreover, a good agreement is achieved between the FE model and experimental results using MTRL calibration for double layer SIW with rectangular slot. A finite model of double layer SIW with rectangular slot shows four different resonant frequencies with 2.71 dB insertion loss. The measurement obtained using the SOLT method displays three different resonant frequencies with 3.41 dB insertion loss. In contrast, the measurement obtained using MTRL calibration displays four different resonant frequencies and 2.87 dB insertion loss. Based on these findings, MTRL calibration predicts more accurately pertaining to single- and multi- layer SIW with close resonant frequencies and low insertion loss as compared with that of the SOLT method. 2017-08 Thesis http://eprints.usm.my/46475/ http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Kejuruteraan Elektrik & Elektronik
institution	Universiti Sains Malaysia
collection	USM Institutional Repository
language	English
topic	T Technology T Technology
spellingShingle	T Technology T Technology Cha, Hong Ye Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
description	Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardware prototype can be designed according to the specifications. Various calibration methods have been applied to the network analyser to obtain the S-parameters, such as shortopen- load-thru (SOLT) and thru-reflect-line (TRL). Substrate integrated waveguide (SIW) demonstrates low loss, compact size, and ease for integration with the planar circuits. In this research, MTRL calibration is proposed to predict the single- and multilayer- SIW. The analytical modelling of MTRL calibration, and the FE models of the prototypes are discussed and simulated. The S-parameters, such as insertion loss, bandwidth, and resonant frequency, can be measured in the frequency range of 8.0 GHz – 13.0 GHz. The S-parameters of the prototype are measured by the proposed MTRL kits and compared with commercial SOLT kits, and validated by FE results. The comparison results between MTRL, SOLT and FE models for single layer SIW are discussed and analysed. MTRL calibration on single layer SIW shows deviation of 0 % - 5.0 % of centre frequency, larger operating bandwidth and closer insertion loss with respect to FE models. Moreover, a good agreement is achieved between the FE model and experimental results using MTRL calibration for double layer SIW with rectangular slot. A finite model of double layer SIW with rectangular slot shows four different resonant frequencies with 2.71 dB insertion loss. The measurement obtained using the SOLT method displays three different resonant frequencies with 3.41 dB insertion loss. In contrast, the measurement obtained using MTRL calibration displays four different resonant frequencies and 2.87 dB insertion loss. Based on these findings, MTRL calibration predicts more accurately pertaining to single- and multi- layer SIW with close resonant frequencies and low insertion loss as compared with that of the SOLT method.
format	Thesis
qualification_level	Master's degree
author	Cha, Hong Ye
author_facet	Cha, Hong Ye
author_sort	Cha, Hong Ye
title	Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_short	Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_full	Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_fullStr	Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_full_unstemmed	Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range
title_sort	thru-reflect-line (trl) calibration on multilayer substrate integrated waveguide (siw) for x-band frequency range
granting_institution	Universiti Sains Malaysia
granting_department	Pusat Pengajian Kejuruteraan Elektrik & Elektronik
publishDate	2017
url	http://eprints.usm.my/46475/1/Thru-Reflect-Line%20%28Trl%29%20Calibration%20On%20Multilayer%20Substrate%20Integrated%20Waveguide%20%28Siw%29%20For%20X-Band%20Frequency%20Range.pdf
_version_	1747821679586836480

Thru-Reflect-Line (Trl) Calibration On Multilayer Substrate Integrated Waveguide (Siw) For X-Band Frequency Range

Similar Items