Thermal And Flicker Noise Analysis In Sample And Hold Circuit
In low-frequency applications, noise is becoming more of an issue as the MOS size reduced. Therefore, the flicker noise and thermal noise are one of the issues found in low-frequency applications. In this work, the thermal noise and flicker noise are modelled and measured on the sample-and-hold c...
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Main Author: | Maniam, Balamurali |
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Format: | Thesis |
Language: | English |
Published: |
2015
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Subjects: | |
Online Access: | http://eprints.usm.my/46871/1/Thermal%20And%20Flicker%20Noise%20Analysis%20In%20Sample%20And%20Hold%20Circuit.pdf |
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