Modified Statistical Process Control For Short Runs Test And Measurement Process To Reduce False Alarm

The key characteristics of test and measurement (T&M) manufacturing are short production runs, multi-product families and testing at multi-stations. Classical Shewhart control charts, namely x̄ chart and R chart have been widely used in statistical process control (SPC). Short production runs in...

全面介绍

Saved in:
书目详细资料
主要作者: Koh, Chin Kok
格式: Thesis
语言:English
出版: 2018
主题:
在线阅读:http://eprints.usm.my/47816/1/Modified%20Statistical%20Process%20Control%20For%20Short%20Runs%20Test%20And%20Measurement%20Process%20To%20Reduce%20False%20Alarm.pdf
标签: 添加标签
没有标签, 成为第一个标记此记录!