Kesan Rawatan Kriogenik Terhadap Struktur Antaramuka Ni/Si Dalam Peranti Silikon Sebagai Pengesan Foto [QC373.P9 Z21 2008 f rb].
Projek ini mengkaji kesan rawatan kriogenik terhadap struktur antaramuka Ni/Si dalam silikon sebagai pengesan foto. This project studied the effects of cryogenic treatment on Ni/Si interface in silicon device as a photodetector.
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Main Author: | Mohd Yusoff, Mohd Zaki |
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Format: | Thesis |
Language: | English |
Published: |
2008
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Subjects: | |
Online Access: | http://eprints.usm.my/8960/1/KESAN_RAWATAN_KRIOGENIK_TERHADAP_STRUKTUR_ANTARAMUKA_NI_SI_DALAM_PERANTI_SILIKON_SEBAGAI_PENGESAN_FOTO.pdf |
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