APA引文

Tan, P. B. Y. (2008). Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 f rb].

Chicago Style (17th ed.) Citation

Tan, Philip Beow Yew. Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 F Rb]. 2008.

MLA引文

Tan, Philip Beow Yew. Compact Modeling Of Deep Submicron CMOS Transistor With Shallow Trench Isolation Mechanical Stress Effect [TK7871.99.M44 T161 2008 F Rb]. 2008.