Lean manufacturing and OEE optimization of semiconductor industry through scheduled downtime reduction at testing process
Semiconductor Manufacturing Industry such as Infineon Technologies Company often looks for ways to improve their production and management processes in order to remain competitive in the market. This calls for ways to reduce production cost, enhance productivity and improve product quality. The aim...
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Format: | Thesis |
Language: | English English |
Published: |
2016
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Online Access: | http://eprints.utem.edu.my/id/eprint/20586/1/Lean%20manufacturing%20and%20OEE%20optimization%20of%20semiconductor%20industry%20through%20scheduled%20downtime%20reduction%20at%20testing%20process.pdf http://eprints.utem.edu.my/id/eprint/20586/2/Lean%20manufacturing%20and%20OEE%20optimization%20of%20semiconductor%20industry%20through%20scheduled%20downtime%20reduction%20at%20testing%20process.pdf |
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Summary: | Semiconductor Manufacturing Industry such as Infineon Technologies Company often looks for ways to improve their production and management processes in order to remain
competitive in the market. This calls for ways to reduce production cost, enhance productivity and improve product quality. The aim is to utilize all the available resources efficiently and effectively in order to provide their customers with high quality products at a low price. Aimed at these motives, several improvement strategies and tools had been proposed to satisfy the organization's needs. Such initiatives include optimizing the Overall Equipment Effectiveness (OEE),lean manufacturing and others. Machine performance is one of the critical factors which reflects productivity capability and often is measured by OEE.A steep production demand ramp-up in year 2015 threatened a potentially huge investment for Microflex machines in Infineon. The objective of the study is to optimize OEE loss of scheduled downtime by reducing change lot duration in order to improve the OEE of MicroFlex machines. DMAIC is one of the adopted systematic approaches to identify the gaps. The biggest challenge is the high complexity of OEE losses that comes from multi-dimensional influencing factors. Several ideas were transformed into holistic and realistic approaches. With zero defect quality in mind, it has never been compromising in quality in the course of action to improve OEE. The most important criteria to an OEE improvement project is to have tracking system categorized its OEE factors and sources of loss in a manner that allow continuous focus on specific correlation of equipment performance. Many lean tools are applied in the report such as Kaizen, MED,MOST Technique, PDCA, SIPOC and others. Several hypotheses are made to seek on the potential improvement plans for change lot time reduction. Each of the hypotheses are verified in the pilot run and justified based on the time study simulation. The overall improvement activities introduced in the study are manufacturing wastes elimination, SMED concept converting the internal activity to external activity and others. Last but not least, the study has successful optimized the scheduled downtime through change lot time reduction after implementation of improvement activities. The results are positive which the scheduled downtime is reduced from 4.1% to 2.9%.Also,the change lot time has shortening from 12.9 minutes to 7.43 minutes. |
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