Improving OEE data quality by automated data collection through identifying productivity potentials

Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE loss...

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Main Author:	Karuppiah, K.Vasanthan
Format:	Thesis
Language:	English English
Published:	2017
Subjects:	T Technology (General) TS Manufactures
Online Access:	http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
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spelling	my-utem-ep.209722022-11-11T12:07:55Z Improving OEE data quality by automated data collection through identifying productivity potentials 2017 Karuppiah, K.Vasanthan T Technology (General) TS Manufactures Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE losses are basic to the improvement studies, however it is difficult to gather reliable and precise information. Hence, people will find the obscure contrasts between the manual recorded losses from their operational system and OEE losses from SEMI standard definition once people execute OEE. Besides, how to acquire the every stoppages of machine in real time to determine equipment stability issued to be conquered. This project is to develop an IT integrate framework to record the equipment process state for the bottleneck process "wire bonder" in the semiconductor assembly industry. Semiconductor equipment interface protocol for equipment to host communication (SECS/GEM) and Manufacturing Execution System (MES) into an Automated Data Collection framework for gathering valuable information. The information quality is further assurance by the real time detection of equipment status from the automate data collection framework. The application of the automate data collection framework is get rid of the unknown OEE losses. This will resolves the accuracy and timeliness issue associated with manual gathering OEE information. 2017 Thesis http://eprints.utem.edu.my/id/eprint/20972/ http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf text en public http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf text en validuser https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104936 mphil masters Universiti Teknikal Malaysia Melaka Faculty of Manufacturing Engineering A. Perumal, Puvanasvaran
institution	Universiti Teknikal Malaysia Melaka
collection	UTeM Repository
language	English English
advisor	A. Perumal, Puvanasvaran
topic	T Technology (General) TS Manufactures
spellingShingle	T Technology (General) TS Manufactures Karuppiah, K.Vasanthan Improving OEE data quality by automated data collection through identifying productivity potentials
description	Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE losses are basic to the improvement studies, however it is difficult to gather reliable and precise information. Hence, people will find the obscure contrasts between the manual recorded losses from their operational system and OEE losses from SEMI standard definition once people execute OEE. Besides, how to acquire the every stoppages of machine in real time to determine equipment stability issued to be conquered. This project is to develop an IT integrate framework to record the equipment process state for the bottleneck process "wire bonder" in the semiconductor assembly industry. Semiconductor equipment interface protocol for equipment to host communication (SECS/GEM) and Manufacturing Execution System (MES) into an Automated Data Collection framework for gathering valuable information. The information quality is further assurance by the real time detection of equipment status from the automate data collection framework. The application of the automate data collection framework is get rid of the unknown OEE losses. This will resolves the accuracy and timeliness issue associated with manual gathering OEE information.
format	Thesis
qualification_name	Master of Philosophy (M.Phil.)
qualification_level	Master's degree
author	Karuppiah, K.Vasanthan
author_facet	Karuppiah, K.Vasanthan
author_sort	Karuppiah, K.Vasanthan
title	Improving OEE data quality by automated data collection through identifying productivity potentials
title_short	Improving OEE data quality by automated data collection through identifying productivity potentials
title_full	Improving OEE data quality by automated data collection through identifying productivity potentials
title_fullStr	Improving OEE data quality by automated data collection through identifying productivity potentials
title_full_unstemmed	Improving OEE data quality by automated data collection through identifying productivity potentials
title_sort	improving oee data quality by automated data collection through identifying productivity potentials
granting_institution	Universiti Teknikal Malaysia Melaka
granting_department	Faculty of Manufacturing Engineering
publishDate	2017
url	http://eprints.utem.edu.my/id/eprint/20972/1/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf http://eprints.utem.edu.my/id/eprint/20972/2/Improving%20OEE%20data%20quality%20by%20automated%20data%20collection%20through%20identifying%20productivity%20potentials.pdf
_version_	1776103112339095552

Improving OEE data quality by automated data collection through identifying productivity potentials

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