Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach

Infineon Technologies Melaka today makes great financial investments in testing their processes and systems to ensure that they will meet customer expectations. The corporations go through all the precise steps to test as thoroughly as possible at a time in many cases at the end consequences are les...

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Main Author:	Maria Amirtha Raj, Michel Raj
Format:	Thesis
Language:	English English
Published:	2017
Subjects:	T Technology (General) TS Manufactures
Online Access:	http://eprints.utem.edu.my/id/eprint/22398/1/Improving%20Overall%20Equipment%20Effectiveness%20Of%20Tesec%20Test%20Handler%20On%20Unloader%20Jamming%20Reduction%20At%20LPL%20Testing%20Area%20Using%20DMAIC%20Approach%20-%20Michel%20Raj%20Maria%20Amirtha%20Raj%20-%2024%20Pages.pdf http://eprints.utem.edu.my/id/eprint/22398/2/Improving%20overall%20equipment%20effectiveness%20of%20tesec%20test%20handler%20on%20unloader%20jamming%20reduction%20at%20LPL%20testing%20area%20using%20DMAIC%20approach.pdf
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id	my-utem-ep.22398
record_format	uketd_dc
institution	Universiti Teknikal Malaysia Melaka
collection	UTeM Repository
language	English English
advisor	Chong, Kuan Eng
topic	T Technology (General) TS Manufactures
spellingShingle	T Technology (General) TS Manufactures Maria Amirtha Raj, Michel Raj Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach
description	Infineon Technologies Melaka today makes great financial investments in testing their processes and systems to ensure that they will meet customer expectations. The corporations go through all the precise steps to test as thoroughly as possible at a time in many cases at the end consequences are less than anticipated for the effort, time and dollars expended where the cost of manufacturing semiconductors continues to increase and has become a main concern in the industry is to do amount of cost saving. The company have been industrialized to reduce cost of test and to keep forward of the competitors. The most common metric used by managements to measure the main effectiveness and success of the TPM is the Overall Equipment Effectiveness (OEE) in Semiconductor Company throughout the world. In spite of having expertise of skilled manpower and high performance fool proof machines yet the production equipment’s still have problematic issues that causes the low performance on the OEE. The objective of the study is to narrow down by defining the major breakdown which causes the handler jamming and find the root cause of the defect, by proper trouble shooting on the test handler which could eliminate jamming and eventually improve the OEE. The DMAIC approaches will systematically applying Define, Measure, Analyse, Improve and Control as it adapts to recognized source of the problem at the defined stage where it provides a systematic methodology. To achieve permanent solution, step by step analysis performed to detect the real root cause eventually could improve OEE and eliminate the jamming of the test handler.
format	Thesis
qualification_name	Master of Philosophy (M.Phil.)
qualification_level	Master's degree
author	Maria Amirtha Raj, Michel Raj
author_facet	Maria Amirtha Raj, Michel Raj
author_sort	Maria Amirtha Raj, Michel Raj
title	Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach
title_short	Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach
title_full	Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach
title_fullStr	Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach
title_full_unstemmed	Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach
title_sort	improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at lpl testing area using dmaic approach
granting_institution	Universiti Teknikal Malaysia Melaka
granting_department	Faculty Of Manufacturing Engineering
publishDate	2017
url	http://eprints.utem.edu.my/id/eprint/22398/1/Improving%20Overall%20Equipment%20Effectiveness%20Of%20Tesec%20Test%20Handler%20On%20Unloader%20Jamming%20Reduction%20At%20LPL%20Testing%20Area%20Using%20DMAIC%20Approach%20-%20Michel%20Raj%20Maria%20Amirtha%20Raj%20-%2024%20Pages.pdf http://eprints.utem.edu.my/id/eprint/22398/2/Improving%20overall%20equipment%20effectiveness%20of%20tesec%20test%20handler%20on%20unloader%20jamming%20reduction%20at%20LPL%20testing%20area%20using%20DMAIC%20approach.pdf
_version_	1747834016505004032
spelling	my-utem-ep.223982022-06-13T10:59:59Z Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach 2017 Maria Amirtha Raj, Michel Raj T Technology (General) TS Manufactures Infineon Technologies Melaka today makes great financial investments in testing their processes and systems to ensure that they will meet customer expectations. The corporations go through all the precise steps to test as thoroughly as possible at a time in many cases at the end consequences are less than anticipated for the effort, time and dollars expended where the cost of manufacturing semiconductors continues to increase and has become a main concern in the industry is to do amount of cost saving. The company have been industrialized to reduce cost of test and to keep forward of the competitors. The most common metric used by managements to measure the main effectiveness and success of the TPM is the Overall Equipment Effectiveness (OEE) in Semiconductor Company throughout the world. In spite of having expertise of skilled manpower and high performance fool proof machines yet the production equipment’s still have problematic issues that causes the low performance on the OEE. The objective of the study is to narrow down by defining the major breakdown which causes the handler jamming and find the root cause of the defect, by proper trouble shooting on the test handler which could eliminate jamming and eventually improve the OEE. The DMAIC approaches will systematically applying Define, Measure, Analyse, Improve and Control as it adapts to recognized source of the problem at the defined stage where it provides a systematic methodology. To achieve permanent solution, step by step analysis performed to detect the real root cause eventually could improve OEE and eliminate the jamming of the test handler. 2017 Thesis http://eprints.utem.edu.my/id/eprint/22398/ http://eprints.utem.edu.my/id/eprint/22398/1/Improving%20Overall%20Equipment%20Effectiveness%20Of%20Tesec%20Test%20Handler%20On%20Unloader%20Jamming%20Reduction%20At%20LPL%20Testing%20Area%20Using%20DMAIC%20Approach%20-%20Michel%20Raj%20Maria%20Amirtha%20Raj%20-%2024%20Pages.pdf text en validuser http://eprints.utem.edu.my/id/eprint/22398/2/Improving%20overall%20equipment%20effectiveness%20of%20tesec%20test%20handler%20on%20unloader%20jamming%20reduction%20at%20LPL%20testing%20area%20using%20DMAIC%20approach.pdf text en validuser https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=108945 mphil masters Universiti Teknikal Malaysia Melaka Faculty Of Manufacturing Engineering Chong, Kuan Eng 1. Alaa M.G., James S.N., (1996). 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Improving overall equipment effectiveness of tesec test handler on unloader jamming reduction at LPL testing area using DMAIC approach

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