Improvement of vision inspection during tip to tip measurement through parameter optimization

During the running of mass production, yield loss is unavoidable. This can be due to various factors which include but not limited due to the incoming material quality, the machine itself or unnecessary rejection of a product. Unnecessary rejection of a good product often occurs during the vision in...

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Main Author:	Rahman, Muhamad Hakim
Format:	Thesis
Language:	English English
Published:	2018
Subjects:	T Technology (General) TJ Mechanical engineering and machinery
Online Access:	http://eprints.utem.edu.my/id/eprint/23963/1/Improvement%20Of%20Vision%20Inspection%20During%20Tip%20To%20Tip%20Measurement%20Through%20Parameter%20Optimization.pdf http://eprints.utem.edu.my/id/eprint/23963/2/Improvement%20of%20vision%20inspection%20during%20tip%20to%20tip%20measurement%20through%20parameter%20optimization.pdf
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spelling	my-utem-ep.239632022-06-13T10:41:14Z Improvement of vision inspection during tip to tip measurement through parameter optimization 2018 Rahman, Muhamad Hakim T Technology (General) TJ Mechanical engineering and machinery During the running of mass production, yield loss is unavoidable. This can be due to various factors which include but not limited due to the incoming material quality, the machine itself or unnecessary rejection of a product. Unnecessary rejection of a good product often occurs during the vision inspection process within the semiconductor industry. The term is usually called over rejection which refers to the excellent unit or product is mistakenly identified as a reject unit by vision inspection system. One of the scenarios that are commonly occurring is at the Acceleration Machine (ACC). ACC machine is a final process within the test and taping process which consists singulation process, pick and place, acceleration test, vision inspection and lastly taping process. Before a device is taped to the reel, the device will go through two vision inspection process; the first is the sides vision inspection and the second is the top view vision inspection. This report presents the research on the optimisation of auto vision inspection at Acceleration Machine (ACC) focusing on the top view vision inspection. The top vision inspection includes checking the tip to tip, Delta lead to lead, lead to lead and laser marking. In this project, the focus is on the potential optimisation of the vision parameter that causes over rejection. The research starts with the identification of the vision parameter that contributes to the over rejection by the vision system. Three-factor has been identified which are the lead shutter time, laser shutter time and brightness value. All the factors will be tested in design expert software. A comprehensive data collection will be conducted to gather important measurements by the vision system. Upon completion of the data collection, the optimization of the parameters will be done using the full factorial method. At the end of this research, the optimize parameter setting will be validated into the dedicated machine to, and monitoring of the result will be conducted base on the defined timeline. Post to the optimized parameter setting, it is hope that the vision will be able to capture measurement value similar to the drawing value within the acceptable tolerance. This will undoubtedly reduce over rejection and indirectly improve the production rate. Validation of the optimal parameter value show that, vision inspection able to capture measurement value with zero delta measurement compare to scope measurement that indicates the optimal value is workable. 2018 Thesis http://eprints.utem.edu.my/id/eprint/23963/ http://eprints.utem.edu.my/id/eprint/23963/1/Improvement%20Of%20Vision%20Inspection%20During%20Tip%20To%20Tip%20Measurement%20Through%20Parameter%20Optimization.pdf text en 2023-08-30 validuser http://eprints.utem.edu.my/id/eprint/23963/2/Improvement%20of%20vision%20inspection%20during%20tip%20to%20tip%20measurement%20through%20parameter%20optimization.pdf text en validuser https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=114814 mphil masters Universiti Teknikal Malaysia Melaka Faculty Of Manufacturing Engineering
institution	Universiti Teknikal Malaysia Melaka
collection	UTeM Repository
language	English English
topic	T Technology (General) TJ Mechanical engineering and machinery
spellingShingle	T Technology (General) TJ Mechanical engineering and machinery Rahman, Muhamad Hakim Improvement of vision inspection during tip to tip measurement through parameter optimization
description	During the running of mass production, yield loss is unavoidable. This can be due to various factors which include but not limited due to the incoming material quality, the machine itself or unnecessary rejection of a product. Unnecessary rejection of a good product often occurs during the vision inspection process within the semiconductor industry. The term is usually called over rejection which refers to the excellent unit or product is mistakenly identified as a reject unit by vision inspection system. One of the scenarios that are commonly occurring is at the Acceleration Machine (ACC). ACC machine is a final process within the test and taping process which consists singulation process, pick and place, acceleration test, vision inspection and lastly taping process. Before a device is taped to the reel, the device will go through two vision inspection process; the first is the sides vision inspection and the second is the top view vision inspection. This report presents the research on the optimisation of auto vision inspection at Acceleration Machine (ACC) focusing on the top view vision inspection. The top vision inspection includes checking the tip to tip, Delta lead to lead, lead to lead and laser marking. In this project, the focus is on the potential optimisation of the vision parameter that causes over rejection. The research starts with the identification of the vision parameter that contributes to the over rejection by the vision system. Three-factor has been identified which are the lead shutter time, laser shutter time and brightness value. All the factors will be tested in design expert software. A comprehensive data collection will be conducted to gather important measurements by the vision system. Upon completion of the data collection, the optimization of the parameters will be done using the full factorial method. At the end of this research, the optimize parameter setting will be validated into the dedicated machine to, and monitoring of the result will be conducted base on the defined timeline. Post to the optimized parameter setting, it is hope that the vision will be able to capture measurement value similar to the drawing value within the acceptable tolerance. This will undoubtedly reduce over rejection and indirectly improve the production rate. Validation of the optimal parameter value show that, vision inspection able to capture measurement value with zero delta measurement compare to scope measurement that indicates the optimal value is workable.
format	Thesis
qualification_name	Master of Philosophy (M.Phil.)
qualification_level	Master's degree
author	Rahman, Muhamad Hakim
author_facet	Rahman, Muhamad Hakim
author_sort	Rahman, Muhamad Hakim
title	Improvement of vision inspection during tip to tip measurement through parameter optimization
title_short	Improvement of vision inspection during tip to tip measurement through parameter optimization
title_full	Improvement of vision inspection during tip to tip measurement through parameter optimization
title_fullStr	Improvement of vision inspection during tip to tip measurement through parameter optimization
title_full_unstemmed	Improvement of vision inspection during tip to tip measurement through parameter optimization
title_sort	improvement of vision inspection during tip to tip measurement through parameter optimization
granting_institution	Universiti Teknikal Malaysia Melaka
granting_department	Faculty Of Manufacturing Engineering
publishDate	2018
url	http://eprints.utem.edu.my/id/eprint/23963/1/Improvement%20Of%20Vision%20Inspection%20During%20Tip%20To%20Tip%20Measurement%20Through%20Parameter%20Optimization.pdf http://eprints.utem.edu.my/id/eprint/23963/2/Improvement%20of%20vision%20inspection%20during%20tip%20to%20tip%20measurement%20through%20parameter%20optimization.pdf
_version_	1747834061218381824

Improvement of vision inspection during tip to tip measurement through parameter optimization

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