Automatic Data Extraction And Management Through Integration With Database At RPT Lab Infineon Technologies

Due to increase in demand and request for reliability qualification and evaluation, Reliability Product Testing (RPT) Lab in Infineon Technologies also outsource electrical testing process at available production testers at production block. However, electrical testing cannot be done through Reliabi...

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Main Author:	Hamdan, Mohd Syamil
Format:	Thesis
Language:	English English
Published:	2020
Subjects:	T Technology (General) TS Manufactures
Online Access:	http://eprints.utem.edu.my/id/eprint/25571/1/Automatic%20Data%20Extraction%20And%20Management%20Through%20Integration%20With%20Database%20At%20RPT%20Lab%20Infineon%20Technologies.pdf http://eprints.utem.edu.my/id/eprint/25571/2/Automatic%20Data%20Extraction%20And%20Management%20Through%20Integration%20With%20Database%20At%20RPT%20Lab%20Infineon%20Technologies.pdf
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id	my-utem-ep.25571
record_format	uketd_dc
institution	Universiti Teknikal Malaysia Melaka
collection	UTeM Repository
language	English English
advisor	Md Fauadi, Muhammad Hafidz Fazli
topic	T Technology (General) TS Manufactures
spellingShingle	T Technology (General) TS Manufactures Hamdan, Mohd Syamil Automatic Data Extraction And Management Through Integration With Database At RPT Lab Infineon Technologies
description	Due to increase in demand and request for reliability qualification and evaluation, Reliability Product Testing (RPT) Lab in Infineon Technologies also outsource electrical testing process at available production testers at production block. However, electrical testing cannot be done through Reliability Evaluation and Logistic Information System (REALIS), instead, it has to be done offline. Due to this certain limitation and condition, data log is sometimes unable to be generated by testers, hence effort and time of operator or technician who conduct the electrical test is wasted. Bound with critical timeline to meet customer demand, missing data log is a huge loss in effort, energy, time and cost for RPT. The main objectives of this research is to identify root cause of data log not able to be produced when test is completed. Apart from that, this study is to optimize existing workflow in preparing the data logs that comply with RPT standard format and are readable by customers. Last but not least, aim of this research is to evaluate the overall benefit of the proposed system. Ishikawa fishbone diagram, flow chart, time study and survey are used to execute the objectives. After the implementation of new flow system, the average rate of missing data log has been significantly reduced and eliminated. The lead time of preparing the data log process has been tremendously reduced to half, from 83.5 minutes/lot to 44.9 minutes/lot. The number of software and application used are also reduced from six to two. Positive feedback from operation team on user-friendliness, efficiency and ergonomic topic have been highlighted and discovered.
format	Thesis
qualification_name	Master of Philosophy (M.Phil.)
qualification_level	Master's degree
author	Hamdan, Mohd Syamil
author_facet	Hamdan, Mohd Syamil
author_sort	Hamdan, Mohd Syamil
title	Automatic Data Extraction And Management Through Integration With Database At RPT Lab Infineon Technologies
title_short	Automatic Data Extraction And Management Through Integration With Database At RPT Lab Infineon Technologies
title_full	Automatic Data Extraction And Management Through Integration With Database At RPT Lab Infineon Technologies
title_fullStr	Automatic Data Extraction And Management Through Integration With Database At RPT Lab Infineon Technologies
title_full_unstemmed	Automatic Data Extraction And Management Through Integration With Database At RPT Lab Infineon Technologies
title_sort	automatic data extraction and management through integration with database at rpt lab infineon technologies
granting_institution	Universiti Teknikal Malaysia Melaka
granting_department	Faculty of Manufacturing Engineering
publishDate	2020
url	http://eprints.utem.edu.my/id/eprint/25571/1/Automatic%20Data%20Extraction%20And%20Management%20Through%20Integration%20With%20Database%20At%20RPT%20Lab%20Infineon%20Technologies.pdf http://eprints.utem.edu.my/id/eprint/25571/2/Automatic%20Data%20Extraction%20And%20Management%20Through%20Integration%20With%20Database%20At%20RPT%20Lab%20Infineon%20Technologies.pdf
_version_	1747834141762650112
spelling	my-utem-ep.255712022-01-06T13:21:48Z Automatic Data Extraction And Management Through Integration With Database At RPT Lab Infineon Technologies 2020 Hamdan, Mohd Syamil T Technology (General) TS Manufactures Due to increase in demand and request for reliability qualification and evaluation, Reliability Product Testing (RPT) Lab in Infineon Technologies also outsource electrical testing process at available production testers at production block. However, electrical testing cannot be done through Reliability Evaluation and Logistic Information System (REALIS), instead, it has to be done offline. Due to this certain limitation and condition, data log is sometimes unable to be generated by testers, hence effort and time of operator or technician who conduct the electrical test is wasted. Bound with critical timeline to meet customer demand, missing data log is a huge loss in effort, energy, time and cost for RPT. The main objectives of this research is to identify root cause of data log not able to be produced when test is completed. Apart from that, this study is to optimize existing workflow in preparing the data logs that comply with RPT standard format and are readable by customers. Last but not least, aim of this research is to evaluate the overall benefit of the proposed system. Ishikawa fishbone diagram, flow chart, time study and survey are used to execute the objectives. After the implementation of new flow system, the average rate of missing data log has been significantly reduced and eliminated. The lead time of preparing the data log process has been tremendously reduced to half, from 83.5 minutes/lot to 44.9 minutes/lot. The number of software and application used are also reduced from six to two. Positive feedback from operation team on user-friendliness, efficiency and ergonomic topic have been highlighted and discovered. 2020 Thesis http://eprints.utem.edu.my/id/eprint/25571/ http://eprints.utem.edu.my/id/eprint/25571/1/Automatic%20Data%20Extraction%20And%20Management%20Through%20Integration%20With%20Database%20At%20RPT%20Lab%20Infineon%20Technologies.pdf text en 2025-08-25 validuser http://eprints.utem.edu.my/id/eprint/25571/2/Automatic%20Data%20Extraction%20And%20Management%20Through%20Integration%20With%20Database%20At%20RPT%20Lab%20Infineon%20Technologies.pdf text en 2025-08-26 validuser https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=119195 mphil masters Universiti Teknikal Malaysia Melaka Faculty of Manufacturing Engineering Md Fauadi, Muhammad Hafidz Fazli 1. Ahmed, M. and Ahmad, N., 2011. An application of Pareto analysis and cause-and-effect diagram (CED) for minimizing rejection of raw materials in lamp production process. 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The strategic adoption of information standard to increase competitiveness in the automotive industry in Thailand. In PICMET 2010 TECHNOLOGY MANAGEMENT FOR GLOBAL ECONOMIC GROWTH (pp. 1-5). IEEE. 6. Edureka, 2019. What are Important Advantages and Disadvantages Of Python? Edureka. Available at: https://www.edureka.co/blog/advantages-and-disadvantages-of-python; [Accessed 29/12/2019] 7. English, M. and Me Creanor, P., 2009. Exploring the differing usages of programming language features in systems developed in C++ and Java. 8. FETtest, 2019. 3600E Dual Head System: Bipolar/FET/Diode. FETtest. Available at: http://www.fettest.com/products/3600E.shtml [Accessed 29/12/2019] Fletcher, S.R., Teegan, J., Adlon, T., Larreina, J., Casla, P., Parigot, L., Alfaro, J.P., Otero, 9. M.d.M., 2019. Adaptive automation assembly: Identifying system requirements for technical efficiency and worker satisfaction. 10. Gupta, A., Kumar, A., 2012. Introduction to semiconductor quality and reliability Part I. EETimes. Available at: https://www.eetimes.com/introduction-to-semiconductor-quality-andreliabilitv-part-i/#. [Accessed on 30/12/2019] 11. Hekmatpanah, M.. 2011. The application of cause and effect diagram in the oil industry in Iran: The case of four liter oil canning process of Sepahan Oil Company. African Journal of Business Management,5(26), pp.10900-10907. 12. Iijima, M. and Yang, S., 2000, November. Development of Japanese-style supply chain management in the auto-electronics industry. In Proceedings of the 2000 IEEE International Conference on Management of Innovation and Technology. ICMIT 2000.'Management in the 21st Century'(Cat. No. 00EX457) (Vol. 2, pp. 765-770). IEEE. Infineon Technologies, 2019. 13. Kanert, W., 2011. April. Reliability of semiconductor devices-the need for simulation. In 2011. 12th Inti. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (pp. 1-5). IEEE. 14. 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ACM, 42(10), pp.109-112. 19. Python, 2019. What is Python? Executive Summary. Python.org. Available at: https://www.pvthon.org/doc/essavs/blurb/ [Accessed 29/12/2019] 20. Ramon, J., Texas Instruments Inc, 2001. Testing method and apparatus assuring semiconductor device quality and reliability. U.S. Patent 6,184,048. 21. Savantini, 2019. Python vs C++: Know what are the differences, Edureka. Available at: https://www.edureka.co/blog/pvthon-vs-cpp/ 22. Sestoft, P., 2010. Numeric performance in C, C# and Java. IT University of Copenhagen, Denmark, 185, p.186. 23. Singh, R., Shah, D., Gohil, A.M., Shah, M.H., 2013. Overall Equipment Effectiveness (OEE) Calculation - Automation through Hardware & Software Development. 24. Sirirattanakul, S., 2000. The study of Electronic Data Interchange (EDI) for Thai customs formalities. 25. Stadnicka, D., Ratnayake, R.M. C., 2016. 7th International Conference on Engineering, Project, and Production Management. Enhancing Aircraft Maintenance Services: a VSM Based Case Study 26. Yamada, Y., Takaku, Y., Yagi, Y., Nakagawa, I., Atsumi, T., Shirai, M., Ohnuma, I. and Ishida, K., 2007. Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device. Microelectronics Reliability, 47(12), pp.2147-2151. 27. Yang, S., Xiang, D., Bryant, A., Mawby, P., Ran, L. and Tavner, P., 2010. Condition monitoring for device reliability in power electronic converters: A review. IEEE Transactions on Power Electronics, 25(11), pp.2734-2752.

Automatic Data Extraction And Management Through Integration With Database At RPT Lab Infineon Technologies

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