Sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application

For the past four decades, indium tin oxide (ITO) thin films have been widely used as transparent and conductive contact layer in several optoelectronic applications due to their high optical transmission and good electrical conductivity. Because of the rapid advancement of optoelectronic devices, n...

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Main Author:	Kabiru Isiyaku, Aliyu
Format:	Thesis
Language:	English English English
Published:	2020
Subjects:	TA401-492 Materials of engineering and construction Mechanics of materials
Online Access:	http://eprints.uthm.edu.my/1137/1/24p%20ALIYU%20KABIRU%20ISIYAKU.pdf http://eprints.uthm.edu.my/1137/2/ALIYU%20KABIRU%20ISIYAKU%20COPYRIGHT%20DECLARATION.pdf http://eprints.uthm.edu.my/1137/3/ALIYU%20KABIRU%20ISIYAKU%20WATERMARK.pdf
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spelling	my-uthm-ep.11372021-09-30T05:14:30Z Sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application 2020-10 Kabiru Isiyaku, Aliyu TA401-492 Materials of engineering and construction. Mechanics of materials For the past four decades, indium tin oxide (ITO) thin films have been widely used as transparent and conductive contact layer in several optoelectronic applications due to their high optical transmission and good electrical conductivity. Because of the rapid advancement of optoelectronic devices, new ITO design and structures are required to improve their performance for use in advanced applications. In this work, multilayer films structures of ITO/Al-Ag/ITO (IAAI) on n-type Si and ITO/Al-Cu/ITO (IACI) on p-type Si were prepared at room temperature by radio frequency (RF) and direct current (DC) magnetron sputtering technique. The microstructural, topological, morphological, optical and electrical properties of the prepared films were investigated after undergoing post-annealing treatment in a range of 300-600oC in air. X-ray diffraction analysis of the as-deposited IAAI and IACI films show an amorphous structure with low intensity and broad diffraction Ag peak at (111) appearing on IAAI film indicating the presence of Ag film in a crystalline phase. The presence of In2O3 crystals peaks with Ag (111) and Al (200) for IAAI films and Cu (111) for IACI films were observed after post-annealing treatment indicating a crystalline improvement in the films. Topological analysis reveals an improved smooth surface topology and grain size with increasing post annealing temperature. The IAAI and IACI films showed better and improved microstructure at 500oC and 600oC respectively. The optical analysis shows a significant increase in transmittance with increasing annealing temperature. High optical transmittance of 91.01 % and 88.70 % for IAAI and IACI films annealed at 500oC and 600oC were obtained. The lowest sheet resistance of 3.81 Ω/sq by IAAI film annealed at 500oC and 3.26 Ω/sq by IACI film annealed at 600oC were obtained. Current-voltage characteristics analysis indicates a superior ohmic behaviour for IAAI films deposited on n-type Si and rectifying contacts on p-type Si for IACI films after post-annealing treatment making them an excellent IAAI/n-Si and IACI/p-Si contacts candidates for Si solar cells application. 2020-10 Thesis http://eprints.uthm.edu.my/1137/ http://eprints.uthm.edu.my/1137/1/24p%20ALIYU%20KABIRU%20ISIYAKU.pdf text en public http://eprints.uthm.edu.my/1137/2/ALIYU%20KABIRU%20ISIYAKU%20COPYRIGHT%20DECLARATION.pdf text en staffonly http://eprints.uthm.edu.my/1137/3/ALIYU%20KABIRU%20ISIYAKU%20WATERMARK.pdf text en validuser phd doctoral Universiti Tun Hussein Onn Malaysia Faculty of Applied Science and Technology
institution	Universiti Tun Hussein Onn Malaysia
collection	UTHM Institutional Repository
language	English English English
topic	TA401-492 Materials of engineering and construction Mechanics of materials
spellingShingle	TA401-492 Materials of engineering and construction Mechanics of materials Kabiru Isiyaku, Aliyu Sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application
description	For the past four decades, indium tin oxide (ITO) thin films have been widely used as transparent and conductive contact layer in several optoelectronic applications due to their high optical transmission and good electrical conductivity. Because of the rapid advancement of optoelectronic devices, new ITO design and structures are required to improve their performance for use in advanced applications. In this work, multilayer films structures of ITO/Al-Ag/ITO (IAAI) on n-type Si and ITO/Al-Cu/ITO (IACI) on p-type Si were prepared at room temperature by radio frequency (RF) and direct current (DC) magnetron sputtering technique. The microstructural, topological, morphological, optical and electrical properties of the prepared films were investigated after undergoing post-annealing treatment in a range of 300-600oC in air. X-ray diffraction analysis of the as-deposited IAAI and IACI films show an amorphous structure with low intensity and broad diffraction Ag peak at (111) appearing on IAAI film indicating the presence of Ag film in a crystalline phase. The presence of In2O3 crystals peaks with Ag (111) and Al (200) for IAAI films and Cu (111) for IACI films were observed after post-annealing treatment indicating a crystalline improvement in the films. Topological analysis reveals an improved smooth surface topology and grain size with increasing post annealing temperature. The IAAI and IACI films showed better and improved microstructure at 500oC and 600oC respectively. The optical analysis shows a significant increase in transmittance with increasing annealing temperature. High optical transmittance of 91.01 % and 88.70 % for IAAI and IACI films annealed at 500oC and 600oC were obtained. The lowest sheet resistance of 3.81 Ω/sq by IAAI film annealed at 500oC and 3.26 Ω/sq by IACI film annealed at 600oC were obtained. Current-voltage characteristics analysis indicates a superior ohmic behaviour for IAAI films deposited on n-type Si and rectifying contacts on p-type Si for IACI films after post-annealing treatment making them an excellent IAAI/n-Si and IACI/p-Si contacts candidates for Si solar cells application.
format	Thesis
qualification_name	Doctor of Philosophy (PhD.)
qualification_level	Doctorate
author	Kabiru Isiyaku, Aliyu
author_facet	Kabiru Isiyaku, Aliyu
author_sort	Kabiru Isiyaku, Aliyu
title	Sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application
title_short	Sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application
title_full	Sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application
title_fullStr	Sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application
title_full_unstemmed	Sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application
title_sort	sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application
granting_institution	Universiti Tun Hussein Onn Malaysia
granting_department	Faculty of Applied Science and Technology
publishDate	2020
url	http://eprints.uthm.edu.my/1137/1/24p%20ALIYU%20KABIRU%20ISIYAKU.pdf http://eprints.uthm.edu.my/1137/2/ALIYU%20KABIRU%20ISIYAKU%20COPYRIGHT%20DECLARATION.pdf http://eprints.uthm.edu.my/1137/3/ALIYU%20KABIRU%20ISIYAKU%20WATERMARK.pdf
_version_	1747830743455760384

Sputter deposition and characterization of metal sandwiched indium tin oxide/silicon for solar cell application

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