Mitigation of oxygen presence in AlN (100) & (002) growth using RF magnetron sputtering

Aluminium nitride (AlN) nucleation layer (NL) is a useful nitride semiconductor for the growth of Gallium Nitride (GaN) on silicon. Major issues related to the fabrication of AlN films are on its crystallographic orientations and high processing temperatures. In order to fabricate AlN NL at low temp...

全面介绍

Saved in:
书目详细资料
主要作者: Bakri, Anis Suhaili
格式: Thesis
语言:English
English
English
出版: 2022
主题:
在线阅读:http://eprints.uthm.edu.my/8399/1/24p%20ANIS%20SUHAILI%20BAKRI.pdf
http://eprints.uthm.edu.my/8399/2/ANIS%20SUHAILI%20BAKRI%20COPYRIGHT%20DECLARATION.pdf
http://eprints.uthm.edu.my/8399/3/ANIS%20SUHAILI%20BAKRI%20WATERMARK.pdf
标签: 添加标签
没有标签, 成为第一个标记此记录!