Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing
Pseudorandom testing is incapable of utilizing the success rate of preceding test patterns while generating subsequent test patterns. Many redundant test patterns have been generated that increase the test length without any significant increase in the fault coverage. An extension to pseudorandom te...
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Language: | English |
| Published: |
2022
|
| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/101819/1/ArbabAlamgirPSKE2022.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|