A. Hamid, F. (2020). Variable oxide thickness optimization and reliability analysis of Gate-All-Around floating gate for flash memory cell.
Chicago Style (17th ed.) CitationA. Hamid, Farah. Variable Oxide Thickness Optimization and Reliability Analysis of Gate-All-Around Floating Gate for Flash Memory Cell. 2020.
MLA (8th ed.) CitationA. Hamid, Farah. Variable Oxide Thickness Optimization and Reliability Analysis of Gate-All-Around Floating Gate for Flash Memory Cell. 2020.
Warning: These citations may not always be 100% accurate.