APA引文

A. Hamid, F. (2020). Variable oxide thickness optimization and reliability analysis of Gate-All-Around floating gate for flash memory cell.

Chicago Style (17th ed.) Citation

A. Hamid, Farah. Variable Oxide Thickness Optimization and Reliability Analysis of Gate-All-Around Floating Gate for Flash Memory Cell. 2020.

MLA引文

A. Hamid, Farah. Variable Oxide Thickness Optimization and Reliability Analysis of Gate-All-Around Floating Gate for Flash Memory Cell. 2020.

警告：这些引文格式不一定是100％准确.