Morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application

Achieving high quality electrode materials for efficient solid oxide fuel cell (SOFC) operation is challenging. SOFC requires porous electrode material. One of the common anode materials used is nickel oxide-yttria stabilized zirconia (NiO-YSZ). NiO-YSZ thin films were successfully deposited on glas...

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Main Author:	Md. Amin, Nor Hidayah
Format:	Thesis
Language:	English
Published:	2019
Subjects:	QC Physics
Online Access:	http://eprints.utm.my/id/eprint/102473/1/NorHidayahMdAminMFS2019.pdf.pdf
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spelling	my-utm-ep.1024732023-08-29T06:36:11Z Morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application 2019 Md. Amin, Nor Hidayah QC Physics Achieving high quality electrode materials for efficient solid oxide fuel cell (SOFC) operation is challenging. SOFC requires porous electrode material. One of the common anode materials used is nickel oxide-yttria stabilized zirconia (NiO-YSZ). NiO-YSZ thin films were successfully deposited on glass substrates using sol-gel dip coating technique. The growth parameters considered were different coating layers (1, 2, 3 and 4 layers), different annealing temperature (300 °C, 400 °C, 500 °C and 600 °C) and different solution temperature (30 °C, 40 °C, 50 °C and 60 °C). The suspension was made from the mixture of NiO-YSZ powder and acetylacetone. All the prepared samples were characterized using X-ray diffraction (XRD), atomic force microscope (AFM), field emission scanning electron microscope (FESEM), energy dispersive X-ray (EDX) spectroscope, four point probe measurement and attenuated total reflectance-Fourier transformed infrared (ATR-FTIR) spectrometer. The thickness of the thin films was measured using surface profiler. The XRD results showed that intensity increased at the Layer-3 as number of coating layers increased. From the FESEM and AFM analysis, the presence of porosity was clearly shown as the number of coating layers and annealing temperature increased. The presence of Ni, O, Y, Zr and Si elements were revealed using EDX spectroscope. The ATR-FTIR results show the presence of bonds at 780 cm-1, 940 cm-1 and 1230 cm-1 which correspond to Si-O, ZrO2 and Zr-O-Si bonding at solution temperature 30 °C. Overall, the present findings conclude that annealing, coating layers and solution temperature play vital role in producing beneficial quality NiO-YSZ thin films for solid oxide fuel cell (SOFC) anode. 2019 Thesis http://eprints.utm.my/id/eprint/102473/ http://eprints.utm.my/id/eprint/102473/1/NorHidayahMdAminMFS2019.pdf.pdf application/pdf en public http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:146355 masters Universiti Teknologi Malaysia Faculty of Science
institution	Universiti Teknologi Malaysia
collection	UTM Institutional Repository
language	English
topic	QC Physics
spellingShingle	QC Physics Md. Amin, Nor Hidayah Morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application
description	Achieving high quality electrode materials for efficient solid oxide fuel cell (SOFC) operation is challenging. SOFC requires porous electrode material. One of the common anode materials used is nickel oxide-yttria stabilized zirconia (NiO-YSZ). NiO-YSZ thin films were successfully deposited on glass substrates using sol-gel dip coating technique. The growth parameters considered were different coating layers (1, 2, 3 and 4 layers), different annealing temperature (300 °C, 400 °C, 500 °C and 600 °C) and different solution temperature (30 °C, 40 °C, 50 °C and 60 °C). The suspension was made from the mixture of NiO-YSZ powder and acetylacetone. All the prepared samples were characterized using X-ray diffraction (XRD), atomic force microscope (AFM), field emission scanning electron microscope (FESEM), energy dispersive X-ray (EDX) spectroscope, four point probe measurement and attenuated total reflectance-Fourier transformed infrared (ATR-FTIR) spectrometer. The thickness of the thin films was measured using surface profiler. The XRD results showed that intensity increased at the Layer-3 as number of coating layers increased. From the FESEM and AFM analysis, the presence of porosity was clearly shown as the number of coating layers and annealing temperature increased. The presence of Ni, O, Y, Zr and Si elements were revealed using EDX spectroscope. The ATR-FTIR results show the presence of bonds at 780 cm-1, 940 cm-1 and 1230 cm-1 which correspond to Si-O, ZrO2 and Zr-O-Si bonding at solution temperature 30 °C. Overall, the present findings conclude that annealing, coating layers and solution temperature play vital role in producing beneficial quality NiO-YSZ thin films for solid oxide fuel cell (SOFC) anode.
format	Thesis
qualification_level	Master's degree
author	Md. Amin, Nor Hidayah
author_facet	Md. Amin, Nor Hidayah
author_sort	Md. Amin, Nor Hidayah
title	Morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application
title_short	Morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application
title_full	Morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application
title_fullStr	Morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application
title_full_unstemmed	Morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application
title_sort	morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application
granting_institution	Universiti Teknologi Malaysia
granting_department	Faculty of Science
publishDate	2019
url	http://eprints.utm.my/id/eprint/102473/1/NorHidayahMdAminMFS2019.pdf.pdf
_version_	1776100931377561600

Morphology, structural and electrical properties of nickel-oxide-yttria-stabilized-zirconia thin film for solid oxide fuel cell electrode application

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