Khoo, V. C. (2021). Mathematical modelling and optimization of multisite efficiency to reduce cost of test in semiconductor final test process using Taguchi method.
Chicago Style (17th ed.) CitationKhoo, Voon Ching. Mathematical Modelling and Optimization of Multisite Efficiency to Reduce Cost of Test in Semiconductor Final Test Process Using Taguchi Method. 2021.
MLA (8th ed.) CitationKhoo, Voon Ching. Mathematical Modelling and Optimization of Multisite Efficiency to Reduce Cost of Test in Semiconductor Final Test Process Using Taguchi Method. 2021.
Warning: These citations may not always be 100% accurate.