Khoo, V. C. (2021). Mathematical modelling and optimization of multisite efficiency to reduce cost of test in semiconductor final test process using Taguchi method.
Chicago Style (17th ed.) CitationKhoo, Voon Ching. Mathematical Modelling and Optimization of Multisite Efficiency to Reduce Cost of Test in Semiconductor Final Test Process Using Taguchi Method. 2021.
MLA引文Khoo, Voon Ching. Mathematical Modelling and Optimization of Multisite Efficiency to Reduce Cost of Test in Semiconductor Final Test Process Using Taguchi Method. 2021.
警告：這些引文格式不一定是100％准確.